Direct fabrication of parallel quantum dots with an atomic force microscope

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • U. F. Keyser
  • M. Paesler
  • U. Zeitler
  • R. J. Haug
  • K. Eberl

Organisationseinheiten

Externe Organisationen

  • Max-Planck-Institut für Festkörperforschung
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Details

OriginalspracheEnglisch
Seiten (von - bis)1155-1158
Seitenumfang4
FachzeitschriftPhysica E: Low-Dimensional Systems and Nanostructures
Jahrgang13
Ausgabenummer2-4
PublikationsstatusVeröffentlicht - März 2002

Abstract

We demonstrate the stepwise fabrication of parallel double quantum dots in GaAs/AlGaAs-heterostructures. The atomic force microscope serves as a direct lithographic tool for the processing of our samples. The devices are characterized by transport measurements. Coulomb-blockade oscillations and diamonds with different periods for the two quantum dots are observed.

ASJC Scopus Sachgebiete

Zitieren

Direct fabrication of parallel quantum dots with an atomic force microscope. / Keyser, U. F.; Paesler, M.; Zeitler, U. et al.
in: Physica E: Low-Dimensional Systems and Nanostructures, Jahrgang 13, Nr. 2-4, 03.2002, S. 1155-1158.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Keyser UF, Paesler M, Zeitler U, Haug RJ, Eberl K. Direct fabrication of parallel quantum dots with an atomic force microscope. Physica E: Low-Dimensional Systems and Nanostructures. 2002 Mär;13(2-4):1155-1158. doi: 10.1016/S1386-9477(02)00325-9
Keyser, U. F. ; Paesler, M. ; Zeitler, U. et al. / Direct fabrication of parallel quantum dots with an atomic force microscope. in: Physica E: Low-Dimensional Systems and Nanostructures. 2002 ; Jahrgang 13, Nr. 2-4. S. 1155-1158.
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