Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | IEEE Sensors, SENSORS 2020 |
| Untertitel | Conference Proceedings |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (elektronisch) | 9781728168012 |
| ISBN (Print) | 978-1-7281-6802-9 |
| Publikationsstatus | Veröffentlicht - 2020 |
| Veranstaltung | 2020 IEEE Sensors, SENSORS 2020 - Virtual, Rotterdam, Niederlande Dauer: 25 Okt. 2020 → 28 Okt. 2020 |
Abstract
This paper shows, that in comparison to conventional polymer foil-based metal strain gauges, sputtered thin-film metal strain gauges enable new measurement positions in harsh environments because of their reduced thickness, fulfilling the modern needs of special industry applications such as drilling bottom hole assemblies. It requires the possibility to sputter directly on components of any size. This is achieved by a novel patented coating system, invented at the IMPT. Due to the direct deposition, there is potential for optimized temperature behavior and higher accuracy that should be shown in this work. After the development of Constantan strain gauges with a low temperature coefficient of resistance (TCR) of-51.5 ppm/°C and a temperature-independent k-factor of 2.05, half-bridge measurement results showed an outstanding temperature compensation capability with a corrected maximum error of just 10 μm/m up to 210 °C while being exposed to varying strain.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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IEEE Sensors, SENSORS 2020: Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 2020. 9278661.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Direct Deposition of Thin-Film Strain Gauges with a New Coating System for Elevated Temperatures
AU - Ottermann, Rico
AU - Klaas, Daniel
AU - Dencker, Folke
AU - Wurz, Marc Christopher
AU - Hoheisel, Dominik
AU - Rottengatter, Peter
AU - Kruspe, Thomas
N1 - Funding Information: ACKNOWLEDGMENT The authors thank the German Research Foundation that funded this work as part of the Collaborative Research Centre 653 “Gentelligent Components in their Lifecycle” within the transfer project T14. Funding Information: Financed by the German Research Foundation as part of the Collaborative Research Centre 653 within the transfer project T14.
PY - 2020
Y1 - 2020
N2 - This paper shows, that in comparison to conventional polymer foil-based metal strain gauges, sputtered thin-film metal strain gauges enable new measurement positions in harsh environments because of their reduced thickness, fulfilling the modern needs of special industry applications such as drilling bottom hole assemblies. It requires the possibility to sputter directly on components of any size. This is achieved by a novel patented coating system, invented at the IMPT. Due to the direct deposition, there is potential for optimized temperature behavior and higher accuracy that should be shown in this work. After the development of Constantan strain gauges with a low temperature coefficient of resistance (TCR) of-51.5 ppm/°C and a temperature-independent k-factor of 2.05, half-bridge measurement results showed an outstanding temperature compensation capability with a corrected maximum error of just 10 μm/m up to 210 °C while being exposed to varying strain.
AB - This paper shows, that in comparison to conventional polymer foil-based metal strain gauges, sputtered thin-film metal strain gauges enable new measurement positions in harsh environments because of their reduced thickness, fulfilling the modern needs of special industry applications such as drilling bottom hole assemblies. It requires the possibility to sputter directly on components of any size. This is achieved by a novel patented coating system, invented at the IMPT. Due to the direct deposition, there is potential for optimized temperature behavior and higher accuracy that should be shown in this work. After the development of Constantan strain gauges with a low temperature coefficient of resistance (TCR) of-51.5 ppm/°C and a temperature-independent k-factor of 2.05, half-bridge measurement results showed an outstanding temperature compensation capability with a corrected maximum error of just 10 μm/m up to 210 °C while being exposed to varying strain.
KW - direct deposition
KW - half-bridge
KW - k-factor
KW - sputtering
KW - strain gauges
KW - TCR
KW - temperature compensation
UR - http://www.scopus.com/inward/record.url?scp=85098723156&partnerID=8YFLogxK
U2 - 10.1109/SENSORS47125.2020.9278661
DO - 10.1109/SENSORS47125.2020.9278661
M3 - Conference contribution
AN - SCOPUS:85098723156
SN - 978-1-7281-6802-9
BT - IEEE Sensors, SENSORS 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 IEEE Sensors, SENSORS 2020
Y2 - 25 October 2020 through 28 October 2020
ER -