Details
Originalsprache | Englisch |
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Titel des Sammelwerks | Optical Metrology and Inspection for Industrial Applications IV |
Herausgeber/-innen | Toru Yoshizawa, Sen Han, Song Zhang |
Herausgeber (Verlag) | SPIE |
ISBN (elektronisch) | 9781510604650 |
Publikationsstatus | Veröffentlicht - 24 Nov. 2016 |
Veranstaltung | Conference on Optical Metrology and Inspection for Industrial Applications IV - Beijing, China Dauer: 12 Okt. 2016 → 14 Okt. 2016 |
Publikationsreihe
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Band | 10023 |
ISSN (Print) | 0277-786X |
ISSN (elektronisch) | 1996-756X |
Abstract
Common 2D laser line triangulation sensors allow a 2D profile measurement in a single line. To scan samples with great curved surfaces like edges, a single laser line triangulation sensor is insufficient. To measure the entire form of such an edge, it normally requires either multiple measurements of one single sensor or a multi sensor system. For this reason, we developed an edge measurement sensor based on an in-house designed polyview optics and the well-known laser triangulation principle. The new developed edge measurement sensor is capable of measuring the object over a 180 field of view (FOV). The configuration, the calibration process and the measurement results of this edge sensor will be discussed in this paper.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
Optical Metrology and Inspection for Industrial Applications IV. Hrsg. / Toru Yoshizawa; Sen Han; Song Zhang. SPIE, 2016. 100231E (Proceedings of SPIE - The International Society for Optical Engineering; Band 10023).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Development of an edge sensor based on polyview optics and laser triangulation principle
AU - Li, Yinan
AU - Bossmeyer, Hagen
AU - Kästner, Markus
AU - Reithmeier, Eduard
PY - 2016/11/24
Y1 - 2016/11/24
N2 - Common 2D laser line triangulation sensors allow a 2D profile measurement in a single line. To scan samples with great curved surfaces like edges, a single laser line triangulation sensor is insufficient. To measure the entire form of such an edge, it normally requires either multiple measurements of one single sensor or a multi sensor system. For this reason, we developed an edge measurement sensor based on an in-house designed polyview optics and the well-known laser triangulation principle. The new developed edge measurement sensor is capable of measuring the object over a 180 field of view (FOV). The configuration, the calibration process and the measurement results of this edge sensor will be discussed in this paper.
AB - Common 2D laser line triangulation sensors allow a 2D profile measurement in a single line. To scan samples with great curved surfaces like edges, a single laser line triangulation sensor is insufficient. To measure the entire form of such an edge, it normally requires either multiple measurements of one single sensor or a multi sensor system. For this reason, we developed an edge measurement sensor based on an in-house designed polyview optics and the well-known laser triangulation principle. The new developed edge measurement sensor is capable of measuring the object over a 180 field of view (FOV). The configuration, the calibration process and the measurement results of this edge sensor will be discussed in this paper.
KW - 3D measurement
KW - Optical systems for inspection and measurements
KW - System calibration
UR - http://www.scopus.com/inward/record.url?scp=85011419289&partnerID=8YFLogxK
U2 - 10.1117/12.2247007
DO - 10.1117/12.2247007
M3 - Conference contribution
AN - SCOPUS:85011419289
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Metrology and Inspection for Industrial Applications IV
A2 - Yoshizawa, Toru
A2 - Han, Sen
A2 - Zhang, Song
PB - SPIE
T2 - Conference on Optical Metrology and Inspection for Industrial Applications IV
Y2 - 12 October 2016 through 14 October 2016
ER -