Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Optical Measurement Systems for Industrial Inspection VI |
| Publikationsstatus | Veröffentlicht - 17 Juli 2009 |
| Veranstaltung | Optical Measurement Systems for Industrial Inspection VI - Munich, Deutschland Dauer: 15 Juni 2009 → 18 Juni 2009 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Band | 7389 |
| ISSN (Print) | 0277-786X |
Abstract
The development of a modified stripe-pattern projection system that uses linescan cameras is presented. The system measures complex-shaped sheet metal parts (<3 m2) and enables the detection of dents (>30 μm) and other defects. Therefore, the measurement system is moved and the parts are scanned line by line. The parallel investigation of a simulation environment in order to optimize the system is shown. The simulation combines optical ray tracing based on the matrix formalism [1] and projective transformation to get an image equivalent to the measured image in the laboratory setup. In order to extract the object's shape from the measured and the simulated line Fourier-Profilometry is used [2]. Therefore a FFT is applied to the data. The power spectra show a central frequency phase modulated with the object's shape. A filtering algorithm, an IFFT and a phase unwrapping algorithm deliver the shape. Both, experimental data and results from the simulation are shown and the noise effects are considered.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
Optical Measurement Systems for Industrial Inspection VI. 2009. 73890F (Proceedings of SPIE - The International Society for Optical Engineering; Band 7389).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Development of a high resolution pattern-projection system using linescan cameras
AU - Denkena, B.
AU - Huke, P.
PY - 2009/7/17
Y1 - 2009/7/17
N2 - The development of a modified stripe-pattern projection system that uses linescan cameras is presented. The system measures complex-shaped sheet metal parts (<3 m2) and enables the detection of dents (>30 μm) and other defects. Therefore, the measurement system is moved and the parts are scanned line by line. The parallel investigation of a simulation environment in order to optimize the system is shown. The simulation combines optical ray tracing based on the matrix formalism [1] and projective transformation to get an image equivalent to the measured image in the laboratory setup. In order to extract the object's shape from the measured and the simulated line Fourier-Profilometry is used [2]. Therefore a FFT is applied to the data. The power spectra show a central frequency phase modulated with the object's shape. A filtering algorithm, an IFFT and a phase unwrapping algorithm deliver the shape. Both, experimental data and results from the simulation are shown and the noise effects are considered.
AB - The development of a modified stripe-pattern projection system that uses linescan cameras is presented. The system measures complex-shaped sheet metal parts (<3 m2) and enables the detection of dents (>30 μm) and other defects. Therefore, the measurement system is moved and the parts are scanned line by line. The parallel investigation of a simulation environment in order to optimize the system is shown. The simulation combines optical ray tracing based on the matrix formalism [1] and projective transformation to get an image equivalent to the measured image in the laboratory setup. In order to extract the object's shape from the measured and the simulated line Fourier-Profilometry is used [2]. Therefore a FFT is applied to the data. The power spectra show a central frequency phase modulated with the object's shape. A filtering algorithm, an IFFT and a phase unwrapping algorithm deliver the shape. Both, experimental data and results from the simulation are shown and the noise effects are considered.
UR - http://www.scopus.com/inward/record.url?scp=70049106131&partnerID=8YFLogxK
U2 - 10.1117/12.823837
DO - 10.1117/12.823837
M3 - Conference contribution
AN - SCOPUS:70049106131
SN - 9780819476722
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Measurement Systems for Industrial Inspection VI
T2 - Optical Measurement Systems for Industrial Inspection VI
Y2 - 15 June 2009 through 18 June 2009
ER -