Determination of the propagation constant of coupled lines on chips based on high frequency measurements

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Autoren

  • Thomas Michael Winkel
  • Lohit Sagar Dutta
  • Hartmut Grabinski
  • Enno Grotelueschen

Organisationseinheiten

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Details

OriginalspracheEnglisch
Seiten99-104
Seitenumfang6
PublikationsstatusVeröffentlicht - 1996
Veranstaltung1996 IEEE Multi-Chip Module Conference - Santa Cruz, USA / Vereinigte Staaten
Dauer: 6 Feb. 1996 → 7 Feb. 1996

Konferenz

Konferenz1996 IEEE Multi-Chip Module Conference
Land/GebietUSA / Vereinigte Staaten
OrtSanta Cruz
Zeitraum6 Feb. 1996 → 7 Feb. 1996

Abstract

A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method will be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements will be presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement.

ASJC Scopus Sachgebiete

Zitieren

Determination of the propagation constant of coupled lines on chips based on high frequency measurements. / Winkel, Thomas Michael; Sagar Dutta, Lohit; Grabinski, Hartmut et al.
1996. 99-104 Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten.

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Winkel, TM, Sagar Dutta, L, Grabinski, H & Grotelueschen, E 1996, 'Determination of the propagation constant of coupled lines on chips based on high frequency measurements', Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, USA / Vereinigte Staaten, 6 Feb. 1996 - 7 Feb. 1996 S. 99-104. https://doi.org/10.1109/MCMC.1996.510777
Winkel, T. M., Sagar Dutta, L., Grabinski, H., & Grotelueschen, E. (1996). Determination of the propagation constant of coupled lines on chips based on high frequency measurements. 99-104. Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten. https://doi.org/10.1109/MCMC.1996.510777
Winkel TM, Sagar Dutta L, Grabinski H, Grotelueschen E. Determination of the propagation constant of coupled lines on chips based on high frequency measurements. 1996. Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten. doi: 10.1109/MCMC.1996.510777
Winkel, Thomas Michael ; Sagar Dutta, Lohit ; Grabinski, Hartmut et al. / Determination of the propagation constant of coupled lines on chips based on high frequency measurements. Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten.6 S.
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