Detecting linear features by spatial point processes

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Autoren

  • Dengfeng Chai
  • Alena Schmidt
  • Christian Heipke

Externe Organisationen

  • Zhejiang University
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)841-848
Seitenumfang8
FachzeitschriftInternational Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives
JahrgangXLI-B3
PublikationsstatusVeröffentlicht - 10 Juni 2016
Veranstaltung23rd International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences Congress, ISPRS 2016 - Prague, Tschechische Republik
Dauer: 12 Juli 201619 Juli 2016

Abstract

This paper proposes a novel approach for linear feature detection. The contribution is twofold: A novel model for spatial point processes and a new method for linear feature detection. It describes a linear feature as a string of points, represents all features in an image as a configuration of a spatial point process, and formulates feature detection as finding the optimal configuration of a spatial point process. Further, a prior term is proposed to favor straight linear configurations, and a data term is constructed to superpose the points on linear features. The proposed approach extracts straight linear features in a global framework. The paper reports ongoing work. As demonstrated in preliminary experiments, globally optimal linear features can be detected.

ASJC Scopus Sachgebiete

Zitieren

Detecting linear features by spatial point processes. / Chai, Dengfeng; Schmidt, Alena; Heipke, Christian.
in: International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives, Jahrgang XLI-B3, 10.06.2016, S. 841-848.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Chai, D, Schmidt, A & Heipke, C 2016, 'Detecting linear features by spatial point processes', International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives, Jg. XLI-B3, S. 841-848. https://doi.org/10.5194/isprs-archives-XLI-B3-841-2016, https://doi.org/10.15488/700
Chai, D., Schmidt, A., & Heipke, C. (2016). Detecting linear features by spatial point processes. International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives, XLI-B3, 841-848. https://doi.org/10.5194/isprs-archives-XLI-B3-841-2016, https://doi.org/10.15488/700
Chai D, Schmidt A, Heipke C. Detecting linear features by spatial point processes. International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives. 2016 Jun 10;XLI-B3:841-848. doi: 10.5194/isprs-archives-XLI-B3-841-2016, 10.15488/700
Chai, Dengfeng ; Schmidt, Alena ; Heipke, Christian. / Detecting linear features by spatial point processes. in: International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives. 2016 ; Jahrgang XLI-B3. S. 841-848.
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