Critical review of converting spectral data into prospective bit error rates

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Autoren

  • Axel Knobloch
  • Heyno Garbe
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Details

OriginalspracheEnglisch
Seiten (von - bis)173-178
Seitenumfang6
FachzeitschriftIEEE International Symposium on Electromagnetic Compatibility
Jahrgang1
PublikationsstatusVeröffentlicht - 2002
Veranstaltung2002 IEEE International Symposium on Electromagnetic Compatibility - Minneapolis, MN, USA / Vereinigte Staaten
Dauer: 19 Aug. 200223 Aug. 2002

Abstract

This paper gives an overview of methods to convert electromagnetic interference for bandpass signals into bit error rates (BER). The different influence parameters are discussed and two possible interference detectors corresponding to bit error rate (weighting detector and an amplitude probability distribution measurement) are described. The use of a pulsed sine-wave as an interference signal is discussed. Examples are given for the modulation scheme minimum shift keying (MSK).

ASJC Scopus Sachgebiete

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Critical review of converting spectral data into prospective bit error rates. / Knobloch, Axel; Garbe, Heyno.
in: IEEE International Symposium on Electromagnetic Compatibility, Jahrgang 1, 2002, S. 173-178.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Knobloch, A & Garbe, H 2002, 'Critical review of converting spectral data into prospective bit error rates', IEEE International Symposium on Electromagnetic Compatibility, Jg. 1, S. 173-178.
Knobloch, A., & Garbe, H. (2002). Critical review of converting spectral data into prospective bit error rates. IEEE International Symposium on Electromagnetic Compatibility, 1, 173-178.
Knobloch A, Garbe H. Critical review of converting spectral data into prospective bit error rates. IEEE International Symposium on Electromagnetic Compatibility. 2002;1:173-178.
Knobloch, Axel ; Garbe, Heyno. / Critical review of converting spectral data into prospective bit error rates. in: IEEE International Symposium on Electromagnetic Compatibility. 2002 ; Jahrgang 1. S. 173-178.
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