Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 65-67 |
| Seitenumfang | 3 |
| Fachzeitschrift | Physica B: Physics of Condensed Matter |
| Jahrgang | 208-209 |
| Ausgabenummer | C |
| Publikationsstatus | Veröffentlicht - 1 März 1995 |
| Extern publiziert | Ja |
Abstract
Using a YB66 monochromator X-ray absorption measurements were carried out at the Al K and Si K absorption edges of a series of aluminosilicate sodalites. The AlOSi bridging angle of the selected sodalites varies from 138° to 148° and the structure of the XANES with its different multiple scattering (MS) features shows a strong angular dependence. Increasing the angle results in a decrease of the MS intensities. This dependence is especially pronounced at the Al K edges which contain a couple of separated well-resolved peaks whereas the corresponding features at the Si K edges are smeared out due to a strong overlapping of the peaks.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: Physica B: Physics of Condensed Matter, Jahrgang 208-209, Nr. C, 01.03.1995, S. 65-67.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Correlation of multiple scattering features in XANES spectra of Al and Si K edges to the AlOSi bond angle in aluminosilicate sodalites
T2 - An empirical study
AU - Fröba, M.
AU - Wong, J.
AU - Behrens, P.
AU - Sieger, P.
AU - Rowen, M.
AU - Tanaka, T.
AU - Rek, Z.
AU - Felsche, J.
N1 - Funding information: The work was performed under the auspices of the US Department of Energy (DOE) by the Lawrence Livermore National Laboratory under contract number W-7405-ENG-48. The measurements were carried at SSRL which is supported by the Chemical Sciences Division of the DOE. M.F. thanks the Alexander von Humboldt Foundation for a Feodor Lynen Research Fellowship.
PY - 1995/3/1
Y1 - 1995/3/1
N2 - Using a YB66 monochromator X-ray absorption measurements were carried out at the Al K and Si K absorption edges of a series of aluminosilicate sodalites. The AlOSi bridging angle of the selected sodalites varies from 138° to 148° and the structure of the XANES with its different multiple scattering (MS) features shows a strong angular dependence. Increasing the angle results in a decrease of the MS intensities. This dependence is especially pronounced at the Al K edges which contain a couple of separated well-resolved peaks whereas the corresponding features at the Si K edges are smeared out due to a strong overlapping of the peaks.
AB - Using a YB66 monochromator X-ray absorption measurements were carried out at the Al K and Si K absorption edges of a series of aluminosilicate sodalites. The AlOSi bridging angle of the selected sodalites varies from 138° to 148° and the structure of the XANES with its different multiple scattering (MS) features shows a strong angular dependence. Increasing the angle results in a decrease of the MS intensities. This dependence is especially pronounced at the Al K edges which contain a couple of separated well-resolved peaks whereas the corresponding features at the Si K edges are smeared out due to a strong overlapping of the peaks.
UR - http://www.scopus.com/inward/record.url?scp=4143060834&partnerID=8YFLogxK
U2 - 10.1016/0921-4526(94)00820-L
DO - 10.1016/0921-4526(94)00820-L
M3 - Article
AN - SCOPUS:4143060834
VL - 208-209
SP - 65
EP - 67
JO - Physica B: Physics of Condensed Matter
JF - Physica B: Physics of Condensed Matter
SN - 0921-4526
IS - C
ER -