Core interconnect testing hazards

Publikation: Beitrag in Fachzeitschrift › Konferenzaufsatz in Fachzeitschrift › Forschung › Peer-Review

Autoren

  • Petra Nordholz
  • Hartmut Grabinski
  • Dieter Treytnar
  • Jan Otterstedt
  • Dirk Niggemeyer
  • Uwe Arz
  • T. W. Williams

Organisationseinheiten

Externe Organisationen

  • IBM
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer655985
Seiten (von - bis)953-954
Seitenumfang2
FachzeitschriftProceedings -Design, Automation and Test in Europe, DATE
PublikationsstatusVeröffentlicht - 1998
VeranstaltungDesign, Automation and Test in Europe, DATE 1998 - Paris, Frankreich
Dauer: 23 Feb. 1998 → 26 Feb. 1998

Abstract

Interconnects must not only be analyzed with regard to opens and shorts but also with regard to the signal delays. Up to now, opens and shorts in bus systems on boards have been tested using boundary scan, mostly neglecting delay test. In addition, it has to be considered that the signal delay (i.e. the time when the signal crosses the switching threshold of the following gate) on a certain line within a bus system depends on the set of input signals of all bus lines. Furthermore, hazards can occur due to coupling between bus lines which can lead to an incorrect function of the whole circuit. Different interconnect systems with different test patterns have been analyzed and the results for 0.10 μm technology will be given. The geometric data for the interconnects in 0.10 μm technology has been derived or directly extracted from the SIA-Roadmap. With this data the line parameters for the simulation of the interconnects have been calculated with the help of a tool which takes into account conducting substrates.

ASJC Scopus Sachgebiete

Zitieren

Core interconnect testing hazards. / Nordholz, Petra; Grabinski, Hartmut; Treytnar, Dieter et al.
in: Proceedings -Design, Automation and Test in Europe, DATE, 1998, S. 953-954.

Publikation: Beitrag in Fachzeitschrift › Konferenzaufsatz in Fachzeitschrift › Forschung › Peer-Review

Nordholz, P, Grabinski, H, Treytnar, D, Otterstedt, J, Niggemeyer, D, Arz, U & Williams, TW 1998, 'Core interconnect testing hazards', Proceedings -Design, Automation and Test in Europe, DATE, S. 953-954. https://doi.org/10.1109/DATE.1998.655985
Nordholz, P., Grabinski, H., Treytnar, D., Otterstedt, J., Niggemeyer, D., Arz, U., & Williams, T. W. (1998). Core interconnect testing hazards. Proceedings -Design, Automation and Test in Europe, DATE, 953-954. Artikel 655985. https://doi.org/10.1109/DATE.1998.655985
Nordholz P, Grabinski H, Treytnar D, Otterstedt J, Niggemeyer D, Arz U et al. Core interconnect testing hazards. Proceedings -Design, Automation and Test in Europe, DATE. 1998;953-954. 655985. doi: 10.1109/DATE.1998.655985
Nordholz, Petra ; Grabinski, Hartmut ; Treytnar, Dieter et al. / Core interconnect testing hazards. in: Proceedings -Design, Automation and Test in Europe, DATE. 1998 ; S. 953-954.
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AU - Nordholz, Petra

AU - Grabinski, Hartmut

AU - Treytnar, Dieter

AU - Otterstedt, Jan

AU - Niggemeyer, Dirk

AU - Arz, Uwe

AU - Williams, T. W.

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