TY - JOUR

T1 - Contactless scattering parameter measurements

AU - Zelder, Thomas

AU - Geck, Bernd

N1 - Funding Information: Manuscript received February 24, 2011; revised June 08, 2011; accepted June 22, 2011. Date of publication August 12, 2011; date of current version September 02, 2011. This work was supported by Rosenberger Hochfrequen-ztechnik GmbH & Co. KG and also by Rohde & Schwarz GmbH & Co. KG and SUSS MicroTec. T. Zelder is with Panasonic Electronic Devices Europe GmbH, Lüneburg 21337, Germany (e-mail: thomas.zelder@eu.panasonic.com). B. Geck is with the Institute of Radiofrequency and Microwave Engineering, Leibniz Universität Hannover, Hannover 30167, Germany. Color versions of one or more of the figures in this letter are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/LMWC.2011.2162619

PY - 2011/9

Y1 - 2011/9

N2 - An introduction to contactless vector network analysis is given for the determination of the scattering parameters of embedded devices. In the measurement setup, contactless probes are connected to a conventional vector network analyzer. Suitable probes are developed for the implementation of a contactless measurement setup, whereas the positioning of the probes is essential for an accurate measurement setup. The contactlessly measured results are compared to results received with a conventional vector network analyzer. These comparisons show that it is possible to characterize embedded devices with the contactless vector network analysis at least up to 6 GHz using the suggested probes.

AB - An introduction to contactless vector network analysis is given for the determination of the scattering parameters of embedded devices. In the measurement setup, contactless probes are connected to a conventional vector network analyzer. Suitable probes are developed for the implementation of a contactless measurement setup, whereas the positioning of the probes is essential for an accurate measurement setup. The contactlessly measured results are compared to results received with a conventional vector network analyzer. These comparisons show that it is possible to characterize embedded devices with the contactless vector network analysis at least up to 6 GHz using the suggested probes.

KW - Calibration technique

KW - contactless scattering-parameter measurement

KW - electromagnetic probe

KW - microwave circuit testing

KW - vector network analyzer (VNA)

UR - http://www.scopus.com/inward/record.url?scp=80052606134&partnerID=8YFLogxK

U2 - 10.1109/LMWC.2011.2162619

DO - 10.1109/LMWC.2011.2162619

M3 - Article

AN - SCOPUS:80052606134

VL - 21

SP - 504

EP - 506

JO - IEEE Microwave and Wireless Components Letters

JF - IEEE Microwave and Wireless Components Letters

SN - 1531-1309

IS - 9

M1 - 5982104

ER -