Details
Originalsprache | Englisch |
---|---|
Titel des Sammelwerks | SENSORS, 2007 IEEE |
Seiten | 79-82 |
Seitenumfang | 4 |
ISBN (elektronisch) | 9781424412624 |
Publikationsstatus | Veröffentlicht - 17 Dez. 2007 |
Extern publiziert | Ja |
Veranstaltung | 6th IEEE Conference on SENSORS - Hyatt Regency Atlanta, Atlanta, USA / Vereinigte Staaten Dauer: 28 Okt. 2007 → 31 Okt. 2007 Konferenznummer: 6 http://ewh.ieee.org/conf/sensors2007/ |
Publikationsreihe
Name | Proceedings of IEEE Sensors |
---|---|
ISSN (Print) | 1930-0395 |
ISSN (elektronisch) | 2168-9229 |
Abstract
Ion mobility spectrometry (IMS) is a widely used method for detecting low ppb-level concentrations of hazardous compounds, such as chemical warfare agents, explosives and pollutants in air. Simple instrumentation combined with high sensitivity and high selectivity are major advantages of this technique. This paper presents both a novel concept of a miniaturized IMS that is capable of identifying hazardous compounds in air at low ppb-levels and a numerical model based on finite element analysis for fast system design. The model described here considers for the fist time all significant physical effects on the ion transport in an IMS, such as diffusion, coulomb repulsion, electric fields and gas flows. The simulations perfectly match the observations made with our experimental setup. This allowed rapid system optimization towards the highest performance possible under the given physical and economic constraints.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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SENSORS, 2007 IEEE. 2007. S. 79-82 (Proceedings of IEEE Sensors).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Concept of a Miniaturized Ion Mobility Spectrometer and a Numerical Model for Fast System Design and Optimization
AU - Barth, S.
AU - Baether, W.
AU - Zimmermann, S.
N1 - Conference code: 6
PY - 2007/12/17
Y1 - 2007/12/17
N2 - Ion mobility spectrometry (IMS) is a widely used method for detecting low ppb-level concentrations of hazardous compounds, such as chemical warfare agents, explosives and pollutants in air. Simple instrumentation combined with high sensitivity and high selectivity are major advantages of this technique. This paper presents both a novel concept of a miniaturized IMS that is capable of identifying hazardous compounds in air at low ppb-levels and a numerical model based on finite element analysis for fast system design. The model described here considers for the fist time all significant physical effects on the ion transport in an IMS, such as diffusion, coulomb repulsion, electric fields and gas flows. The simulations perfectly match the observations made with our experimental setup. This allowed rapid system optimization towards the highest performance possible under the given physical and economic constraints.
AB - Ion mobility spectrometry (IMS) is a widely used method for detecting low ppb-level concentrations of hazardous compounds, such as chemical warfare agents, explosives and pollutants in air. Simple instrumentation combined with high sensitivity and high selectivity are major advantages of this technique. This paper presents both a novel concept of a miniaturized IMS that is capable of identifying hazardous compounds in air at low ppb-levels and a numerical model based on finite element analysis for fast system design. The model described here considers for the fist time all significant physical effects on the ion transport in an IMS, such as diffusion, coulomb repulsion, electric fields and gas flows. The simulations perfectly match the observations made with our experimental setup. This allowed rapid system optimization towards the highest performance possible under the given physical and economic constraints.
UR - http://www.scopus.com/inward/record.url?scp=48349118705&partnerID=8YFLogxK
U2 - 10.1109/ICSENS.2007.4388340
DO - 10.1109/ICSENS.2007.4388340
M3 - Conference contribution
AN - SCOPUS:48349118705
SN - 9781424412617
T3 - Proceedings of IEEE Sensors
SP - 79
EP - 82
BT - SENSORS, 2007 IEEE
T2 - 6th IEEE Conference on SENSORS
Y2 - 28 October 2007 through 31 October 2007
ER -