Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 524-527 |
| Seitenumfang | 4 |
| Fachzeitschrift | Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report |
| Jahrgang | 2 |
| Publikationsstatus | Veröffentlicht - 1998 |
| Veranstaltung | 1998 67th IEEE Annual Conference on Electrical Insulation and Dielectric Phenomena. Part 1 (of 2) - Atlanta, GA, USA Dauer: 25 Okt. 1998 → 28 Okt. 1998 |
Abstract
This paper deals with a comparison of the partial discharge (PD) behavior of epoxy resin impregnated coils under high voltage and high current stress. Due to the availability of a new method, it is possible to conduct PD measurements in combination with a pulse-width-modulation (PWM) amplifier [1]. By this method, the PD behavior of coils under current stress can be determined. A comparison between the measurement results under voltage and current stress shows, that the PD inception voltages are higher under current stress than under voltage stress. These results suggest, that it is necessary to conduct PD measurements under current stress in order to make an accurate prediction on the PD behavior under normal operating conditions. Furthermore, a new method for locating PD sources is presented. Under special circumstances, it is possible to locate a PD source by a comparison of the PD inception voltages between voltage stress and current stress.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Ingenieurwesen (insg.)
- Wirtschaftsingenieurwesen und Fertigungstechnik
- Ingenieurwesen (insg.)
- Bauwesen
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in: Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report, Jahrgang 2, 1998, S. 524-527.
Publikation: Beitrag in Fachzeitschrift › Konferenzaufsatz in Fachzeitschrift › Forschung › Peer-Review
}
TY - JOUR
T1 - Comparison of partial discharge behavior of epoxy resin impregnated coils under high voltage and high current stress
AU - Koschnitzki, T.
AU - Nowak, S.
AU - Kaindl, A.
AU - Borsi, H.
N1 - Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 1998
Y1 - 1998
N2 - This paper deals with a comparison of the partial discharge (PD) behavior of epoxy resin impregnated coils under high voltage and high current stress. Due to the availability of a new method, it is possible to conduct PD measurements in combination with a pulse-width-modulation (PWM) amplifier [1]. By this method, the PD behavior of coils under current stress can be determined. A comparison between the measurement results under voltage and current stress shows, that the PD inception voltages are higher under current stress than under voltage stress. These results suggest, that it is necessary to conduct PD measurements under current stress in order to make an accurate prediction on the PD behavior under normal operating conditions. Furthermore, a new method for locating PD sources is presented. Under special circumstances, it is possible to locate a PD source by a comparison of the PD inception voltages between voltage stress and current stress.
AB - This paper deals with a comparison of the partial discharge (PD) behavior of epoxy resin impregnated coils under high voltage and high current stress. Due to the availability of a new method, it is possible to conduct PD measurements in combination with a pulse-width-modulation (PWM) amplifier [1]. By this method, the PD behavior of coils under current stress can be determined. A comparison between the measurement results under voltage and current stress shows, that the PD inception voltages are higher under current stress than under voltage stress. These results suggest, that it is necessary to conduct PD measurements under current stress in order to make an accurate prediction on the PD behavior under normal operating conditions. Furthermore, a new method for locating PD sources is presented. Under special circumstances, it is possible to locate a PD source by a comparison of the PD inception voltages between voltage stress and current stress.
UR - http://www.scopus.com/inward/record.url?scp=0032315826&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0032315826
VL - 2
SP - 524
EP - 527
JO - Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
JF - Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
SN - 0084-9162
T2 - 1998 67th IEEE Annual Conference on Electrical Insulation and Dielectric Phenomena. Part 1 (of 2)
Y2 - 25 October 1998 through 28 October 1998
ER -