Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 39th Annual Boulder Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials |
| Untertitel | 2007 |
| Publikationsstatus | Veröffentlicht - 20 Dez. 2007 |
| Extern publiziert | Ja |
| Veranstaltung | 39th Annual Symposium on Optical Materials for High-Power Lasers - Boulder, CO, USA / Vereinigte Staaten Dauer: 24 Sept. 2007 → 26 Sept. 2007 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Band | 6720 |
| ISSN (Print) | 0277-786X |
Abstract
The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO 2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
39th Annual Boulder Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2007. 2007. 672013 (Proceedings of SPIE - The International Society for Optical Engineering; Band 6720).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Comparison of Gaussian and top-hat beam profiles in LIDT testing
AU - Jensen, Lars
AU - Jupé, Marco
AU - Starke, Kai
AU - Ristau, Detlev
AU - Riede, Wolfgang
AU - Allenspacher, P.
PY - 2007/12/20
Y1 - 2007/12/20
N2 - The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO 2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.
AB - The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO 2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.
KW - Beam profile
KW - Inclusion density
KW - ISO 11254
KW - LIDT
UR - http://www.scopus.com/inward/record.url?scp=45549083821&partnerID=8YFLogxK
U2 - 10.1117/12.752873
DO - 10.1117/12.752873
M3 - Conference contribution
AN - SCOPUS:45549083821
SN - 9780819468772
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 39th Annual Boulder Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials
T2 - 39th Annual Symposium on Optical Materials for High-Power Lasers
Y2 - 24 September 2007 through 26 September 2007
ER -