Details
Originalsprache | Englisch |
---|---|
Seiten (von - bis) | 3389-3395 |
Seitenumfang | 7 |
Fachzeitschrift | Applied Optics |
Jahrgang | 50 |
Ausgabenummer | 20 |
Publikationsstatus | Veröffentlicht - 10 Juli 2011 |
Abstract
Two algorithms used for the on-line and off-line characterization of multilayer optical coatings are experimentally compared using test samples produced by two different deposition processes and different monitoring approaches. One of these algorithms, called the triangular algorithm, demonstrates its superiority in all considered situations. We performed experiments with multilayer samples formed by high-density thin films, which allowed us to neglect possible errors in the film refractive indices and concentrate only on errors in the thicknesses of the layers of the produced coatings.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Ingenieurwesen (insg.)
- Ingenieurwesen (sonstige)
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: Applied Optics, Jahrgang 50, Nr. 20, 10.07.2011, S. 3389-3395.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Comparison of algorithms used for optical characterization of multilayer optical coatings
AU - Amotchkina, Tatiana V.
AU - Trubetskov, Michael K.
AU - Pervak, Vladimir
AU - Schlichting, Sebastian
AU - Ehlers, Henrik
AU - Ristau, Detlev
AU - Tikhonravov, Alexander V.
PY - 2011/7/10
Y1 - 2011/7/10
N2 - Two algorithms used for the on-line and off-line characterization of multilayer optical coatings are experimentally compared using test samples produced by two different deposition processes and different monitoring approaches. One of these algorithms, called the triangular algorithm, demonstrates its superiority in all considered situations. We performed experiments with multilayer samples formed by high-density thin films, which allowed us to neglect possible errors in the film refractive indices and concentrate only on errors in the thicknesses of the layers of the produced coatings.
AB - Two algorithms used for the on-line and off-line characterization of multilayer optical coatings are experimentally compared using test samples produced by two different deposition processes and different monitoring approaches. One of these algorithms, called the triangular algorithm, demonstrates its superiority in all considered situations. We performed experiments with multilayer samples formed by high-density thin films, which allowed us to neglect possible errors in the film refractive indices and concentrate only on errors in the thicknesses of the layers of the produced coatings.
UR - http://www.scopus.com/inward/record.url?scp=79960204780&partnerID=8YFLogxK
U2 - 10.1364/AO.50.003389
DO - 10.1364/AO.50.003389
M3 - Article
AN - SCOPUS:79960204780
VL - 50
SP - 3389
EP - 3395
JO - Applied Optics
JF - Applied Optics
SN - 1559-128X
IS - 20
ER -