Details
Originalsprache | Englisch |
---|---|
Seiten (von - bis) | 063823 |
Seitenumfang | 1 |
Fachzeitschrift | Physical Review A |
Jahrgang | 82 |
Ausgabenummer | 6 |
Publikationsstatus | Veröffentlicht - 2010 |
Abstract
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in: Physical Review A, Jahrgang 82, Nr. 6, 2010, S. 063823.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
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TY - JOUR
T1 - Coherent Nonlinear Single Molecule Microscopy
AU - Gerhardt, I.
AU - Wrigge, G.
AU - Hwang, J.
AU - Zumofen, G.
AU - Sandoghdar, V.
PY - 2010
Y1 - 2010
N2 - We investigate a nonlinear localization microscopy method based on Rabi oscillations of single emitters. We demonstrate the fundamental working principle of this new technique using a cryogenic far-field experiment in which subwavelength features smaller than $/10 are obtained. Using Monte Carlo simulations, we show the superior localization accuracy of this method under realistic conditions and a potential for higher acquisition speed or a lower number of required photons as compared to conventional linear schemes. The method can be adapted to other emitters than molecules and allows for the localization of several emitters at different distances to a single measurement pixel.
AB - We investigate a nonlinear localization microscopy method based on Rabi oscillations of single emitters. We demonstrate the fundamental working principle of this new technique using a cryogenic far-field experiment in which subwavelength features smaller than $/10 are obtained. Using Monte Carlo simulations, we show the superior localization accuracy of this method under realistic conditions and a potential for higher acquisition speed or a lower number of required photons as compared to conventional linear schemes. The method can be adapted to other emitters than molecules and allows for the localization of several emitters at different distances to a single measurement pixel.
KW - Coherent state preparation
KW - Rabi imaging
KW - Quantum Optics
KW - Gradient Imaging
M3 - Article
VL - 82
SP - 063823
JO - Physical Review A
JF - Physical Review A
SN - 2469-9926
IS - 6
ER -