Details
| Originalsprache | Englisch |
|---|---|
| Aufsatznummer | 7073577 |
| Seiten (von - bis) | 616-622 |
| Seitenumfang | 7 |
| Fachzeitschrift | IEEE Transactions on Electromagnetic Compatibility |
| Jahrgang | 57 |
| Ausgabenummer | 4 |
| Publikationsstatus | Veröffentlicht - 31 März 2015 |
Abstract
The result of any measurement will only be of significance if the uncertainty of the measurement method can be specified concerning its influence quantities. In the case of CISPR compliant-radiated disturbance measurements, the result of the measurement is usually compared to a given limit line. For established test methods (ETM), this comparison can be done directly if the expanded measurement uncertainty falls below a value stated for a typical test facility by the standard. In this paper, the definitions and the classification the CISPR describes for ETM are applied to transverse electromagnetic (TEM) waveguide measurements. It is shown that the overall uncertainty of a typical TEM waveguide is slightly lower than that of a typical ETM.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: IEEE Transactions on Electromagnetic Compatibility, Jahrgang 57, Nr. 4, 7073577, 31.03.2015, S. 616-622.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - CISPR 16-4-2 Equivalent Measurement Uncertainty Analysis for TEM Waveguides
AU - Hamann, David
AU - Konerding, May Britt
AU - Garbe, Heyno
PY - 2015/3/31
Y1 - 2015/3/31
N2 - The result of any measurement will only be of significance if the uncertainty of the measurement method can be specified concerning its influence quantities. In the case of CISPR compliant-radiated disturbance measurements, the result of the measurement is usually compared to a given limit line. For established test methods (ETM), this comparison can be done directly if the expanded measurement uncertainty falls below a value stated for a typical test facility by the standard. In this paper, the definitions and the classification the CISPR describes for ETM are applied to transverse electromagnetic (TEM) waveguide measurements. It is shown that the overall uncertainty of a typical TEM waveguide is slightly lower than that of a typical ETM.
AB - The result of any measurement will only be of significance if the uncertainty of the measurement method can be specified concerning its influence quantities. In the case of CISPR compliant-radiated disturbance measurements, the result of the measurement is usually compared to a given limit line. For established test methods (ETM), this comparison can be done directly if the expanded measurement uncertainty falls below a value stated for a typical test facility by the standard. In this paper, the definitions and the classification the CISPR describes for ETM are applied to transverse electromagnetic (TEM) waveguide measurements. It is shown that the overall uncertainty of a typical TEM waveguide is slightly lower than that of a typical ETM.
KW - Dielectric test stand
KW - field homogeneity
KW - measurement uncertainty
KW - TEM waveguide
UR - http://www.scopus.com/inward/record.url?scp=85027935459&partnerID=8YFLogxK
U2 - 10.1109/TEMC.2015.2413832
DO - 10.1109/TEMC.2015.2413832
M3 - Article
AN - SCOPUS:85027935459
VL - 57
SP - 616
EP - 622
JO - IEEE Transactions on Electromagnetic Compatibility
JF - IEEE Transactions on Electromagnetic Compatibility
SN - 0018-9375
IS - 4
M1 - 7073577
ER -