Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • P. Kury
  • P. Zahl
  • M. Horn-von Hoegen
  • C. Voges
  • H. Frischat
  • H. L. Günter
  • Herbert Pfnür
  • Martin Henzler

Organisationseinheiten

Externe Organisationen

  • Universität Duisburg-Essen
  • IBM Zurich Research Laboratory
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Details

OriginalspracheEnglisch
Seiten (von - bis)4911-4915
Seitenumfang5
FachzeitschriftReview of Scientific Instruments
Jahrgang75
Ausgabenummer11
PublikationsstatusVeröffentlicht - 2 Nov. 2004

Abstract

Spot profile analysis low energy electron diffraction (SPA-LEED) is one of the most versatile and powerful methods for the determination of the structure and morphology of surfaces even at elevated temperatures. In setups where the sample is heated directly by an electric current, the resolution of the diffraction images at higher temperatures can be heavily degraded due to the inhomogeneous electric and magnetic fields around the sample. Here we present an easily applicable modification of the common data acquisition hardware of the SPA-LEED, which enables the system to work in a pulsed heating mode: Instead of heating the sample with a constant current, a square wave is used and electron counting is only performed when the current through the sample vanishes. Thus, undistorted diffration images can be acquired at high temperatures.

ASJC Scopus Sachgebiete

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Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures. / Kury, P.; Zahl, P.; Horn-von Hoegen, M. et al.
in: Review of Scientific Instruments, Jahrgang 75, Nr. 11, 02.11.2004, S. 4911-4915.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Kury P, Zahl P, Horn-von Hoegen M, Voges C, Frischat H, Günter HL et al. Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures. Review of Scientific Instruments. 2004 Nov 2;75(11):4911-4915. doi: 10.1063/1.1807003
Kury, P. ; Zahl, P. ; Horn-von Hoegen, M. et al. / Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures. in: Review of Scientific Instruments. 2004 ; Jahrgang 75, Nr. 11. S. 4911-4915.
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