Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems |
| Untertitel | EuroSimE |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seitenumfang | 5 |
| ISBN (elektronisch) | 9798350393637 |
| ISBN (Print) | 979-8-3503-9364-4 |
| Publikationsstatus | Veröffentlicht - 2024 |
| Veranstaltung | 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024 - Catania, Italien Dauer: 7 Apr. 2024 → 10 Apr. 2024 |
Abstract
When using Field-Programmable Gate Arrays (FPGA) in safety-critical and harsh environments, it is important to understand possible faults and implement appropriate mitigation to prevent critical system errors. Electronic components can be affected by radiation, including naturally occurring background radiation. Due to their reconfigurability, FPGAs exhibit faults not only with regard to application data but also the configuration memory, which defines the functionality of the logic circuit. This paper proposes an experiment that irradiates a logic circuit running on Artix-7-35T FPGA devices using neutron radiation with a particle energy of 2.45 MeV. During the irradiation, data is written into the on-device block RAM components and read back for further investigation. The data read back from the device is checked for errors in both the configuration and the functional level memory. A static analysis of the radiation effects, which can be used as a basis for a statistical fault model, is presented, and a brief discussion of dynamic effects, including transient errors, is given.
ASJC Scopus Sachgebiete
- Chemische Verfahrenstechnik (insg.)
- Fließ- und Transferprozesse von Flüssigkeiten
- Ingenieurwesen (insg.)
- Numerische Mechanik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Ingenieurwesen (insg.)
- Sicherheit, Risiko, Zuverlässigkeit und Qualität
- Werkstoffwissenschaften (insg.)
- Keramische und Verbundwerkstoffe
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Mathematik (insg.)
- Modellierung und Simulation
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems: EuroSimE . Institute of Electrical and Electronics Engineers Inc., 2024.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Characterization of Soft Errors on a 28-nm SRAM-based FPGA under Neutron Radiation Exposure
AU - Trumann, Eike
AU - Thieu, Gia Bao
AU - Schmechel, Johannes
AU - Weide-Zaage, Kirsten
AU - Wolff, Dorian Von
AU - Bausen, Andre
AU - Paya-Vaya, Guillermo
AU - Müller, Alexander
PY - 2024
Y1 - 2024
N2 - When using Field-Programmable Gate Arrays (FPGA) in safety-critical and harsh environments, it is important to understand possible faults and implement appropriate mitigation to prevent critical system errors. Electronic components can be affected by radiation, including naturally occurring background radiation. Due to their reconfigurability, FPGAs exhibit faults not only with regard to application data but also the configuration memory, which defines the functionality of the logic circuit. This paper proposes an experiment that irradiates a logic circuit running on Artix-7-35T FPGA devices using neutron radiation with a particle energy of 2.45 MeV. During the irradiation, data is written into the on-device block RAM components and read back for further investigation. The data read back from the device is checked for errors in both the configuration and the functional level memory. A static analysis of the radiation effects, which can be used as a basis for a statistical fault model, is presented, and a brief discussion of dynamic effects, including transient errors, is given.
AB - When using Field-Programmable Gate Arrays (FPGA) in safety-critical and harsh environments, it is important to understand possible faults and implement appropriate mitigation to prevent critical system errors. Electronic components can be affected by radiation, including naturally occurring background radiation. Due to their reconfigurability, FPGAs exhibit faults not only with regard to application data but also the configuration memory, which defines the functionality of the logic circuit. This paper proposes an experiment that irradiates a logic circuit running on Artix-7-35T FPGA devices using neutron radiation with a particle energy of 2.45 MeV. During the irradiation, data is written into the on-device block RAM components and read back for further investigation. The data read back from the device is checked for errors in both the configuration and the functional level memory. A static analysis of the radiation effects, which can be used as a basis for a statistical fault model, is presented, and a brief discussion of dynamic effects, including transient errors, is given.
UR - http://www.scopus.com/inward/record.url?scp=85191184850&partnerID=8YFLogxK
U2 - 10.1109/EuroSimE60745.2024.10491535
DO - 10.1109/EuroSimE60745.2024.10491535
M3 - Conference contribution
AN - SCOPUS:85191184850
SN - 979-8-3503-9364-4
BT - 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024
Y2 - 7 April 2024 through 10 April 2024
ER -