Characterization of porous surfaces with spatial point pattern analysis

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OriginalspracheEnglisch
Titel des SammelwerksPhotonics, Devices, and Systems VI
Herausgeber/-innenDagmar Senderakova, Pavel Tomanek, Pavel Tomanek, Petr Pata, Petr Pata
Herausgeber (Verlag)SPIE
Seitenumfang8
ISBN (elektronisch)9781628415667
PublikationsstatusVeröffentlicht - 6 Jan. 2015
VeranstaltungPhotonics, Devices, and Systems VI - Prague, Tschechische Republik
Dauer: 27 Aug. 201429 Aug. 2014

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Band9450
ISSN (Print)0277-786X
ISSN (elektronisch)1996-756X

Abstract

Nowadays thermal plasma spray coating is widespread in automobile industry. For example, in the cylinder manufacturing process coatings are applied for friction reduction, wear and corrosion resistance. After the honing process, a coated surface exhibits porous microstructures, which are often characterized in order to understand functional correlations between key parameters of the pores and friction performance. In this paper, spatial point pattern analysis is used to investigate the pores' distribution in a two dimensional space. Methods, such as nearest neighbor analysis and Ripley's K-function, are used to conduct the experiments to analyze the observer's pattern. Different edge correction methods in Ripley's K-function are introduced. Confidence envelopes are simulated using the Monte Carlo method. Experimental results are presented to reveal the patterns of pores, where influences of the selected measurement area on the results are taken into account and further discussed.

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Characterization of porous surfaces with spatial point pattern analysis. / Zou, Yibo; Kästner, Markus; Reithmeier, Eduard.
Photonics, Devices, and Systems VI. Hrsg. / Dagmar Senderakova; Pavel Tomanek; Pavel Tomanek; Petr Pata; Petr Pata. SPIE, 2015. 94500B (Proceedings of SPIE - The International Society for Optical Engineering; Band 9450).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Zou, Y, Kästner, M & Reithmeier, E 2015, Characterization of porous surfaces with spatial point pattern analysis. in D Senderakova, P Tomanek, P Tomanek, P Pata & P Pata (Hrsg.), Photonics, Devices, and Systems VI., 94500B, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 9450, SPIE, Photonics, Devices, and Systems VI, Prague, Tschechische Republik, 27 Aug. 2014. https://doi.org/10.1117/12.2070329, https://doi.org/10.15488/1749
Zou, Y., Kästner, M., & Reithmeier, E. (2015). Characterization of porous surfaces with spatial point pattern analysis. In D. Senderakova, P. Tomanek, P. Tomanek, P. Pata, & P. Pata (Hrsg.), Photonics, Devices, and Systems VI Artikel 94500B (Proceedings of SPIE - The International Society for Optical Engineering; Band 9450). SPIE. https://doi.org/10.1117/12.2070329, https://doi.org/10.15488/1749
Zou Y, Kästner M, Reithmeier E. Characterization of porous surfaces with spatial point pattern analysis. in Senderakova D, Tomanek P, Tomanek P, Pata P, Pata P, Hrsg., Photonics, Devices, and Systems VI. SPIE. 2015. 94500B. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2070329, 10.15488/1749
Zou, Yibo ; Kästner, Markus ; Reithmeier, Eduard. / Characterization of porous surfaces with spatial point pattern analysis. Photonics, Devices, and Systems VI. Hrsg. / Dagmar Senderakova ; Pavel Tomanek ; Pavel Tomanek ; Petr Pata ; Petr Pata. SPIE, 2015. (Proceedings of SPIE - The International Society for Optical Engineering).
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