Characterization of multilayer structures for soft x-ray laser research

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Autoren

  • M. Kühne
  • K. Danzmann
  • P. Muller
  • B. Wende
  • N. M. Ceglio
  • D. G. Stearns
  • A. M. Hawryluk

Externe Organisationen

  • Physikalisch-Technische Bundesanstalt (PTB)
  • Lawrence Livermore National Laboratory
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)76-80
Seitenumfang5
FachzeitschriftProceedings of SPIE - The International Society for Optical Engineering
Jahrgang688
PublikationsstatusVeröffentlicht - 9 Apr. 1987
Extern publiziertJa
Veranstaltung30th Annual Technical Symposium - San Diego , USA / Vereinigte Staaten
Dauer: 1 Aug. 19863 Aug. 1986

Abstract

A reflectometer has been set up at the radiometric laboratory of PTB at the Berlin electron storage ring BESSY. Special attention has been paid to optimize the instrumentation for the characterization of multilayer structures suitable for laboratory soft x-ray laser research. The instrumentation is described and its performance demonstrated showing examples of optical component characterization.

ASJC Scopus Sachgebiete

Zitieren

Characterization of multilayer structures for soft x-ray laser research. / Kühne, M.; Danzmann, K.; Muller, P. et al.
in: Proceedings of SPIE - The International Society for Optical Engineering, Jahrgang 688, 09.04.1987, S. 76-80.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Kühne, M, Danzmann, K, Muller, P, Wende, B, Ceglio, NM, Stearns, DG & Hawryluk, AM 1987, 'Characterization of multilayer structures for soft x-ray laser research', Proceedings of SPIE - The International Society for Optical Engineering, Jg. 688, S. 76-80. https://doi.org/10.1117/12.964825
Kühne, M., Danzmann, K., Muller, P., Wende, B., Ceglio, N. M., Stearns, D. G., & Hawryluk, A. M. (1987). Characterization of multilayer structures for soft x-ray laser research. Proceedings of SPIE - The International Society for Optical Engineering, 688, 76-80. https://doi.org/10.1117/12.964825
Kühne M, Danzmann K, Muller P, Wende B, Ceglio NM, Stearns DG et al. Characterization of multilayer structures for soft x-ray laser research. Proceedings of SPIE - The International Society for Optical Engineering. 1987 Apr 9;688:76-80. doi: 10.1117/12.964825
Kühne, M. ; Danzmann, K. ; Muller, P. et al. / Characterization of multilayer structures for soft x-ray laser research. in: Proceedings of SPIE - The International Society for Optical Engineering. 1987 ; Jahrgang 688. S. 76-80.
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AU - Muller, P.

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AU - Ceglio, N. M.

AU - Stearns, D. G.

AU - Hawryluk, A. M.

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