Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschung

Autoren

  • P. J. Ritter
  • M. Tollkuehn
  • M. Schilling
  • B. Hampel
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Details

OriginalspracheEnglisch
Titel des Sammelwerks2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022)
ISBN (elektronisch)9781728194271
PublikationsstatusVeröffentlicht - 2022
Extern publiziertJa

Publikationsreihe

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Band2022-August
ISSN (Print)2162-2027
ISSN (elektronisch)2162-2035

Abstract

Terahertz (THz) gas lasers produce high output powers and can emit radiation at several lines with different lasing mediums. Often emission of multiple frequencies occurs with one lasing medium, which cannot be spectroscopically resolved with a thermal sensor. Our THz microscope employs a Josephson cantilever as a sensor, which relies on the Josephson effect. Thus, the sensor can record the incident spectrum. Additionally, the sensor can be moved during measurements. Hence, our setup enables the spectroscopic and spatial evaluation of multi-frequency far-infrared laser emission in one measurement. In this work, we present measurements of multiple laser lines, which are simultaneously recorded at frequencies between 1 THz and 1.4 THz.

ASJC Scopus Sachgebiete

Zitieren

Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope. / Ritter, P. J.; Tollkuehn, M.; Schilling, M. et al.
2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022). 2022. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; Band 2022-August).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschung

Ritter, PJ, Tollkuehn, M, Schilling, M & Hampel, B 2022, Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope. in 2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022). International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, Bd. 2022-August. https://doi.org/10.1109/irmmw-thz50927.2022.9895908
Ritter, P. J., Tollkuehn, M., Schilling, M., & Hampel, B. (2022). Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope. In 2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022) (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; Band 2022-August). https://doi.org/10.1109/irmmw-thz50927.2022.9895908
Ritter PJ, Tollkuehn M, Schilling M, Hampel B. Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope. in 2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022). 2022. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). doi: 10.1109/irmmw-thz50927.2022.9895908
Ritter, P. J. ; Tollkuehn, M. ; Schilling, M. et al. / Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope. 2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022). 2022. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz).
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AU - Tollkuehn, M.

AU - Schilling, M.

AU - Hampel, B.

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N2 - Terahertz (THz) gas lasers produce high output powers and can emit radiation at several lines with different lasing mediums. Often emission of multiple frequencies occurs with one lasing medium, which cannot be spectroscopically resolved with a thermal sensor. Our THz microscope employs a Josephson cantilever as a sensor, which relies on the Josephson effect. Thus, the sensor can record the incident spectrum. Additionally, the sensor can be moved during measurements. Hence, our setup enables the spectroscopic and spatial evaluation of multi-frequency far-infrared laser emission in one measurement. In this work, we present measurements of multiple laser lines, which are simultaneously recorded at frequencies between 1 THz and 1.4 THz.

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