Characterization of loaded TEM-waveguides using time-domain reflectometry

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • J. P. Kärst
  • H. Garbe
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Details

OriginalspracheEnglisch
Titel des SammelwerksIEEE International Symposium on Electromagnetic Compatibility
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten127-132
Seitenumfang6
ISBN (elektronisch)078035057X, 9780780350571
PublikationsstatusVeröffentlicht - 1999
Veranstaltung1999 IEEE International Symposium on Electromagnetic Compatibility, EMC 1999 - Seattle, USA / Vereinigte Staaten
Dauer: 2 Aug. 19996 Aug. 1999

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
Band1
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Abstract

An approach is presented to characterize the load state of a TEM-waveguide using the local characteristic impedance Zc(z) derived from time-domain reflectometry (TDR) measurements. The field homogeneity and the field polarization can be estimated using the deviation from the intended Zc=50 Ω of the empty TEM-waveguide. Considering wave propagation only in the TEM-mode an analytical relationship between load state and characteristic impedance is derived. Multiple reflections due to the nonuniformity of the loaded TEM-waveguide and higher order modes excited by the load are taken into account. Experimental results are presented using a GTEM-cell with several load states.

ASJC Scopus Sachgebiete

Zitieren

Characterization of loaded TEM-waveguides using time-domain reflectometry. / Kärst, J. P.; Garbe, H.
IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., 1999. S. 127-132 812881 (IEEE International Symposium on Electromagnetic Compatibility; Band 1).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Kärst, JP & Garbe, H 1999, Characterization of loaded TEM-waveguides using time-domain reflectometry. in IEEE International Symposium on Electromagnetic Compatibility., 812881, IEEE International Symposium on Electromagnetic Compatibility, Bd. 1, Institute of Electrical and Electronics Engineers Inc., S. 127-132, 1999 IEEE International Symposium on Electromagnetic Compatibility, EMC 1999, Seattle, USA / Vereinigte Staaten, 2 Aug. 1999. https://doi.org/10.1109/ISEMC.1999.812881
Kärst, J. P., & Garbe, H. (1999). Characterization of loaded TEM-waveguides using time-domain reflectometry. In IEEE International Symposium on Electromagnetic Compatibility (S. 127-132). Artikel 812881 (IEEE International Symposium on Electromagnetic Compatibility; Band 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.1999.812881
Kärst JP, Garbe H. Characterization of loaded TEM-waveguides using time-domain reflectometry. in IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc. 1999. S. 127-132. 812881. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/ISEMC.1999.812881
Kärst, J. P. ; Garbe, H. / Characterization of loaded TEM-waveguides using time-domain reflectometry. IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., 1999. S. 127-132 (IEEE International Symposium on Electromagnetic Compatibility).
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