Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 11th International Congress Molded Interconnect Devices |
| Untertitel | Scientific Proceedings |
| Herausgeber/-innen | Jörg Franke, Thomas Kuhn, Andreas Pojtinger, Albert Birkicht |
| Seiten | 63-68 |
| Seitenumfang | 6 |
| ISBN (elektronisch) | 9783038352525 |
| Publikationsstatus | Elektronisch veröffentlicht (E-Pub) - Sept. 2014 |
| Veranstaltung | 11th International Congress Molded Interconnect Devices, MID 2014 - Nürnberg / Fürth, Deutschland Dauer: 24 Sept. 2014 → 25 Sept. 2014 |
Publikationsreihe
| Name | Advanced Materials Research |
|---|---|
| Band | 1038 |
| ISSN (Print) | 1022-6680 |
| ISSN (elektronisch) | 1662-8985 |
Abstract
This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
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11th International Congress Molded Interconnect Devices : Scientific Proceedings. Hrsg. / Jörg Franke; Thomas Kuhn; Andreas Pojtinger; Albert Birkicht. 2014. S. 63-68 (Advanced Materials Research; Band 1038).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz
AU - Huy Dao, Quang
AU - Friedrich, Aline
AU - Geck, Bernd
PY - 2014/9
Y1 - 2014/9
N2 - This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
AB - This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
KW - Conduction losses
KW - Electromagnetic properties
KW - MID materials
UR - http://www.scopus.com/inward/record.url?scp=84913582130&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.1038.63
DO - 10.4028/www.scientific.net/AMR.1038.63
M3 - Conference contribution
AN - SCOPUS:84913582130
T3 - Advanced Materials Research
SP - 63
EP - 68
BT - 11th International Congress Molded Interconnect Devices
A2 - Franke, Jörg
A2 - Kuhn, Thomas
A2 - Pojtinger, Andreas
A2 - Birkicht, Albert
T2 - 11th International Congress Molded Interconnect Devices, MID 2014
Y2 - 24 September 2014 through 25 September 2014
ER -