Characterization of 8 fs deep-UV pulses using XPW dispersion scan

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

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Externe Organisationen

  • Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (MBI)
  • Laser Zentrum Hannover e.V. (LZH)
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Details

OriginalspracheEnglisch
Titel des Sammelwerks2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
UntertitelProceedings
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seitenumfang1
ISBN (elektronisch)978-1-7281-0469-0, 978-1-7281-0470-6
PublikationsstatusVeröffentlicht - Juni 2019
Veranstaltung2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 - Munich, Deutschland
Dauer: 23 Juni 201927 Juni 2019

Abstract

The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

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Characterization of 8 fs deep-UV pulses using XPW dispersion scan. / Tajalli, Ayhan; Kalousdian, Thomas K.; Kretschmar, Martin et al.
2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8871814.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Tajalli, A, Kalousdian, TK, Kretschmar, M, Kleinert, S, Morgner, U & Nagy, T 2019, Characterization of 8 fs deep-UV pulses using XPW dispersion scan. in 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings., 8871814, Institute of Electrical and Electronics Engineers Inc., 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, Deutschland, 23 Juni 2019. https://doi.org/10.1109/CLEOE-EQEC.2019.8871814
Tajalli, A., Kalousdian, T. K., Kretschmar, M., Kleinert, S., Morgner, U., & Nagy, T. (2019). Characterization of 8 fs deep-UV pulses using XPW dispersion scan. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings Artikel 8871814 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOE-EQEC.2019.8871814
Tajalli A, Kalousdian TK, Kretschmar M, Kleinert S, Morgner U, Nagy T. Characterization of 8 fs deep-UV pulses using XPW dispersion scan. in 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. 8871814 doi: 10.1109/CLEOE-EQEC.2019.8871814
Tajalli, Ayhan ; Kalousdian, Thomas K. ; Kretschmar, Martin et al. / Characterization of 8 fs deep-UV pulses using XPW dispersion scan. 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019.
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title = "Characterization of 8 fs deep-UV pulses using XPW dispersion scan",
abstract = "The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.",
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AU - Tajalli, Ayhan

AU - Kalousdian, Thomas K.

AU - Kretschmar, Martin

AU - Kleinert, Sven

AU - Morgner, Uwe

AU - Nagy, Tamas

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AB - The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

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