Causal Characteristic Impedance of Planar Transmission Lines

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autorschaft

  • Dylan F. Williams
  • Bradley K. Alpert
  • Uwe Arz
  • David K. Walker
  • Hartmut Grabinski

Externe Organisationen

  • National Institute of Standards and Technology (NIST)
  • Physikalisch-Technische Bundesanstalt (PTB)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)165-171
Seitenumfang7
FachzeitschriftIEEE Transactions on Advanced Packaging
Jahrgang26
Ausgabenummer2
PublikationsstatusVeröffentlicht - Mai 2003

Abstract

Power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip and coplanar-waveguide transmission lines was computed. It was shown that the minimum-phase constraints on the characteristic impedance required by the causal theory were met by the power/voltage and power/current definitions in the planar transmission lines. Causal minimum-phase characteristic impedances were measured by the constant-capacitance method and the calibration-comparison method.

ASJC Scopus Sachgebiete

Zitieren

Causal Characteristic Impedance of Planar Transmission Lines. / Williams, Dylan F.; Alpert, Bradley K.; Arz, Uwe et al.
in: IEEE Transactions on Advanced Packaging, Jahrgang 26, Nr. 2, 05.2003, S. 165-171.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Williams, DF, Alpert, BK, Arz, U, Walker, DK & Grabinski, H 2003, 'Causal Characteristic Impedance of Planar Transmission Lines', IEEE Transactions on Advanced Packaging, Jg. 26, Nr. 2, S. 165-171. https://doi.org/10.1109/TADVP.2003.817339
Williams, D. F., Alpert, B. K., Arz, U., Walker, D. K., & Grabinski, H. (2003). Causal Characteristic Impedance of Planar Transmission Lines. IEEE Transactions on Advanced Packaging, 26(2), 165-171. https://doi.org/10.1109/TADVP.2003.817339
Williams DF, Alpert BK, Arz U, Walker DK, Grabinski H. Causal Characteristic Impedance of Planar Transmission Lines. IEEE Transactions on Advanced Packaging. 2003 Mai;26(2):165-171. doi: 10.1109/TADVP.2003.817339
Williams, Dylan F. ; Alpert, Bradley K. ; Arz, Uwe et al. / Causal Characteristic Impedance of Planar Transmission Lines. in: IEEE Transactions on Advanced Packaging. 2003 ; Jahrgang 26, Nr. 2. S. 165-171.
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