Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials |
| Untertitel | 2010 |
| Publikationsstatus | Veröffentlicht - 2 Dez. 2010 |
| Veranstaltung | 42nd Annual Laser Damage Symposium: Laser-Induced Damage in Optical Materials: 2010 - Boulder, CO, USA / Vereinigte Staaten Dauer: 26 Sept. 2010 → 29 Sept. 2010 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Band | 7842 |
| ISSN (Print) | 0277-786X |
Abstract
In the ultra short laser pulse regime, the damage process is driven by the interaction of the laser pulse with the electronic structure of the material. The way of excitations in dielectric materials is dominated by multi photon and avalanche ionization processes. Often, the complete theoretical description is limited by the lack of knowledge of the precise material properties. Usually, LIDT measurement data are only available for pure materials (e.g. TiO 2, Ta2O5 or SiO2). The development of composite materials opens the way to vary material properties, continuously. Additionally, all material changes are based on the same chemical elements in different compositions. The paper compares measurement results of the University of New Mexico and Vilnius University performed on the same set of Ti xSi1-xO2-mixtures to calculations based on Keldysh theory. When applying simple approximations for the physical properties of the mixture, the theoretical description agrees well with the measurement results.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2010. 2010. 78420Z (Proceedings of SPIE - The International Society for Optical Engineering; Band 7842).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Calculation and measurement of fs-LIDT of TixSi 1-xO2-mixtures
AU - Jupé, Marco
AU - Jensen, Lars
AU - Mende, Mathias
AU - Ristau, Detlev
AU - Melninkaitis, Andrius
AU - Sirutkaitis, Valdas
AU - Nguyen, Duy
AU - Emmert, Luke
AU - Rudolph, Wolfgang
PY - 2010/12/2
Y1 - 2010/12/2
N2 - In the ultra short laser pulse regime, the damage process is driven by the interaction of the laser pulse with the electronic structure of the material. The way of excitations in dielectric materials is dominated by multi photon and avalanche ionization processes. Often, the complete theoretical description is limited by the lack of knowledge of the precise material properties. Usually, LIDT measurement data are only available for pure materials (e.g. TiO 2, Ta2O5 or SiO2). The development of composite materials opens the way to vary material properties, continuously. Additionally, all material changes are based on the same chemical elements in different compositions. The paper compares measurement results of the University of New Mexico and Vilnius University performed on the same set of Ti xSi1-xO2-mixtures to calculations based on Keldysh theory. When applying simple approximations for the physical properties of the mixture, the theoretical description agrees well with the measurement results.
AB - In the ultra short laser pulse regime, the damage process is driven by the interaction of the laser pulse with the electronic structure of the material. The way of excitations in dielectric materials is dominated by multi photon and avalanche ionization processes. Often, the complete theoretical description is limited by the lack of knowledge of the precise material properties. Usually, LIDT measurement data are only available for pure materials (e.g. TiO 2, Ta2O5 or SiO2). The development of composite materials opens the way to vary material properties, continuously. Additionally, all material changes are based on the same chemical elements in different compositions. The paper compares measurement results of the University of New Mexico and Vilnius University performed on the same set of Ti xSi1-xO2-mixtures to calculations based on Keldysh theory. When applying simple approximations for the physical properties of the mixture, the theoretical description agrees well with the measurement results.
KW - fs-LIDT
KW - Keldysh theory
KW - material dependence of LIDT
KW - MRE -model
UR - http://www.scopus.com/inward/record.url?scp=79751521804&partnerID=8YFLogxK
U2 - 10.1117/12.867736
DO - 10.1117/12.867736
M3 - Conference contribution
AN - SCOPUS:79751521804
SN - 9780819483652
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 42nd Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials
T2 - 42nd Annual Laser Damage Symposium
Y2 - 26 September 2010 through 29 September 2010
ER -