Details
| Titel in Übersetzung | Evaluation of the deformation of transient signals within GTEM cells |
|---|---|
| Originalsprache | Deutsch |
| Seiten (von - bis) | 157-165 |
| Seitenumfang | 9 |
| Fachzeitschrift | Technisches Messen |
| Jahrgang | 84 |
| Ausgabenummer | 3 |
| Publikationsstatus | Veröffentlicht - 28 März 2017 |
Abstract
The verification of transversal electromagnetic (TEM) waveguides, especially GTEM cells, is described in the standard IEC 61000-4-20 in the frequency and time domain. The verification in time domain is based on a nuclear electromagnetic pulse (NEMP) with a double exponential waveform, with is defined by two parameters, the rise time and pulsewidth, and the given parameter limits. A verification of the transmission qualitiy of a GTEM cell for arbitrary transient signals based on these parameters is not possible. Furthermore, it is not possible to identify critical frequencies of the performed waveguide with such an ultra-wideband pulse. Due to new upcoming signal shapes in the communications engineering and the use of transient signals in electromagnetic compatibility (EMC) issues, a verification of waveguides for these waveform is essential. The method presented in this paper allows the qualification of a TEM waveguide for arbitrary transient signals. A signal comparison based on a correlation is performed, which quantifies the transmission quality of a waveguide for the performed transient shape.
Schlagwörter
- EMC immunity testing, TEM waveguide verification
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Instrumentierung
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: Technisches Messen, Jahrgang 84, Nr. 3, 28.03.2017, S. 157-165.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Bewertung der Formveränderung transienter Signale in GTEM-Zellen
AU - Briest, Niklas
AU - Garbe, Heyno
AU - Potthast, Stefan
N1 - Publisher Copyright: © 2017 Walter de Gruyter Berlin/Boston. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/3/28
Y1 - 2017/3/28
N2 - The verification of transversal electromagnetic (TEM) waveguides, especially GTEM cells, is described in the standard IEC 61000-4-20 in the frequency and time domain. The verification in time domain is based on a nuclear electromagnetic pulse (NEMP) with a double exponential waveform, with is defined by two parameters, the rise time and pulsewidth, and the given parameter limits. A verification of the transmission qualitiy of a GTEM cell for arbitrary transient signals based on these parameters is not possible. Furthermore, it is not possible to identify critical frequencies of the performed waveguide with such an ultra-wideband pulse. Due to new upcoming signal shapes in the communications engineering and the use of transient signals in electromagnetic compatibility (EMC) issues, a verification of waveguides for these waveform is essential. The method presented in this paper allows the qualification of a TEM waveguide for arbitrary transient signals. A signal comparison based on a correlation is performed, which quantifies the transmission quality of a waveguide for the performed transient shape.
AB - The verification of transversal electromagnetic (TEM) waveguides, especially GTEM cells, is described in the standard IEC 61000-4-20 in the frequency and time domain. The verification in time domain is based on a nuclear electromagnetic pulse (NEMP) with a double exponential waveform, with is defined by two parameters, the rise time and pulsewidth, and the given parameter limits. A verification of the transmission qualitiy of a GTEM cell for arbitrary transient signals based on these parameters is not possible. Furthermore, it is not possible to identify critical frequencies of the performed waveguide with such an ultra-wideband pulse. Due to new upcoming signal shapes in the communications engineering and the use of transient signals in electromagnetic compatibility (EMC) issues, a verification of waveguides for these waveform is essential. The method presented in this paper allows the qualification of a TEM waveguide for arbitrary transient signals. A signal comparison based on a correlation is performed, which quantifies the transmission quality of a waveguide for the performed transient shape.
KW - EMC immunity testing
KW - TEM waveguide verification
UR - http://www.scopus.com/inward/record.url?scp=85014618284&partnerID=8YFLogxK
U2 - 10.1515/teme-2016-0076
DO - 10.1515/teme-2016-0076
M3 - Artikel
AN - SCOPUS:85014618284
VL - 84
SP - 157
EP - 165
JO - Technisches Messen
JF - Technisches Messen
SN - 0171-8096
IS - 3
ER -