Benefit of microscopic diffusion measurement for the characterization of nanoporous materials

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Autoren

  • Jörg Kärger
  • Jürgen Caro
  • Pegie Cool
  • Marc Olivier Coppens
  • Deborah Jones
  • Freek Kapteijn
  • Francisco Rodríguez-Reinoso
  • Michael Stöcker
  • Doros Theodorou
  • Etienne F. Vansant
  • Jens Weitkamp

Organisationseinheiten

Externe Organisationen

  • Universität Leipzig
  • Universiteit Antwerpen (UAntwerpen)
  • Rensselaer Polytechnic Institute
  • Delft University of Technology
  • Centre national de la recherche scientifique (CNRS)
  • Universidad de Alicante
  • SINTEF Industry
  • Nationale Technische Universität Athen (NTUA)
  • Universität Stuttgart
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Details

OriginalspracheEnglisch
Seiten (von - bis)1494-1511
Seitenumfang18
FachzeitschriftChemical Engineering and Technology
Jahrgang32
Ausgabenummer10
PublikationsstatusVeröffentlicht - 25 Sept. 2009

Abstract

Detailed knowledge of the transport properties of nanoporous materials is a pre-requisite for their complete characterization and optimum technological exploitation. One of the best ways to attain this information is provided by the "microscopic" techniques of diffusion measurement, in particular by the pulsed field gradient technique of NMR and by interference microscopy and IR microscopy. Starting with the measuring principles, the various types of evidence as accessible by these techniques are illustrated. A large variety of host-guest systems with both ordered and random pore networks have been studied, from microporous up to macroporous materials. The information obtained concerns diffusivities in the various pore domains, extra resistances at the interfaces between them and the associated exchange rates.

ASJC Scopus Sachgebiete

Zitieren

Benefit of microscopic diffusion measurement for the characterization of nanoporous materials. / Kärger, Jörg; Caro, Jürgen; Cool, Pegie et al.
in: Chemical Engineering and Technology, Jahrgang 32, Nr. 10, 25.09.2009, S. 1494-1511.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Kärger, J, Caro, J, Cool, P, Coppens, MO, Jones, D, Kapteijn, F, Rodríguez-Reinoso, F, Stöcker, M, Theodorou, D, Vansant, EF & Weitkamp, J 2009, 'Benefit of microscopic diffusion measurement for the characterization of nanoporous materials', Chemical Engineering and Technology, Jg. 32, Nr. 10, S. 1494-1511. https://doi.org/10.1002/ceat.200900160
Kärger, J., Caro, J., Cool, P., Coppens, M. O., Jones, D., Kapteijn, F., Rodríguez-Reinoso, F., Stöcker, M., Theodorou, D., Vansant, E. F., & Weitkamp, J. (2009). Benefit of microscopic diffusion measurement for the characterization of nanoporous materials. Chemical Engineering and Technology, 32(10), 1494-1511. https://doi.org/10.1002/ceat.200900160
Kärger J, Caro J, Cool P, Coppens MO, Jones D, Kapteijn F et al. Benefit of microscopic diffusion measurement for the characterization of nanoporous materials. Chemical Engineering and Technology. 2009 Sep 25;32(10):1494-1511. doi: 10.1002/ceat.200900160
Kärger, Jörg ; Caro, Jürgen ; Cool, Pegie et al. / Benefit of microscopic diffusion measurement for the characterization of nanoporous materials. in: Chemical Engineering and Technology. 2009 ; Jahrgang 32, Nr. 10. S. 1494-1511.
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AU - Caro, Jürgen

AU - Cool, Pegie

AU - Coppens, Marc Olivier

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AU - Kapteijn, Freek

AU - Rodríguez-Reinoso, Francisco

AU - Stöcker, Michael

AU - Theodorou, Doros

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