Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 4168-4179 |
| Seitenumfang | 12 |
| Fachzeitschrift | Applied Optics |
| Jahrgang | 56 |
| Ausgabenummer | 14 |
| Publikationsstatus | Veröffentlicht - 9 Mai 2017 |
Abstract
To optically capture the topography of a hot measurement object with high precision, the light deflection by the inhomogeneous refractive index field - induced by the heat transfer from the measurement object to the ambient medium - has to be considered. We used the 2D background oriented schlieren method with illuminated wavelet background, an optical flow algorithm, and Ciddor's equation to quantify the refractive index field located directly above a red-glowing, hot measurement object. A heat transfer simulation has been implemented to verify the magnitude and the shape of the measured refractive index field. Provided that no forced external flow is disturbing the shape of the convective flow originating from the hot object, a laminar flow can be observed directly above the object, resulting in a sharply bounded, inhomogeneous refractive index field.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Ingenieurwesen (insg.)
- Ingenieurwesen (sonstige)
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: Applied Optics, Jahrgang 56, Nr. 14, 09.05.2017, S. 4168-4179.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Background oriented schlieren measurement of the refractive index field of air induced by a hot, cylindrical measurement object
AU - Beermann, Rüdiger
AU - Quentin, Lorenz
AU - Pösch, Andreas
AU - Reithmeier, Eduard
AU - Kästner, Markus
N1 - Funding information: Subproject C5 Process Chain to Produce Hybrid High Performance Components by Tailored Forming Deutsche Forschungsgemeinschaft (DFG); Collaborative Research Centre 1153 (CRC); Subproject C5 Process Chain to Produce Hybrid High Performance Components by Tailored Forming. We would like to thank Mr. Schmidtmann for his contributions to the measurement setup during his diploma thesis and Mr. Dietz for his expertise on optical flow algorithms.
PY - 2017/5/9
Y1 - 2017/5/9
N2 - To optically capture the topography of a hot measurement object with high precision, the light deflection by the inhomogeneous refractive index field - induced by the heat transfer from the measurement object to the ambient medium - has to be considered. We used the 2D background oriented schlieren method with illuminated wavelet background, an optical flow algorithm, and Ciddor's equation to quantify the refractive index field located directly above a red-glowing, hot measurement object. A heat transfer simulation has been implemented to verify the magnitude and the shape of the measured refractive index field. Provided that no forced external flow is disturbing the shape of the convective flow originating from the hot object, a laminar flow can be observed directly above the object, resulting in a sharply bounded, inhomogeneous refractive index field.
AB - To optically capture the topography of a hot measurement object with high precision, the light deflection by the inhomogeneous refractive index field - induced by the heat transfer from the measurement object to the ambient medium - has to be considered. We used the 2D background oriented schlieren method with illuminated wavelet background, an optical flow algorithm, and Ciddor's equation to quantify the refractive index field located directly above a red-glowing, hot measurement object. A heat transfer simulation has been implemented to verify the magnitude and the shape of the measured refractive index field. Provided that no forced external flow is disturbing the shape of the convective flow originating from the hot object, a laminar flow can be observed directly above the object, resulting in a sharply bounded, inhomogeneous refractive index field.
UR - http://www.scopus.com/inward/record.url?scp=85019221519&partnerID=8YFLogxK
U2 - 10.1364/AO.56.004168
DO - 10.1364/AO.56.004168
M3 - Article
C2 - 29047550
AN - SCOPUS:85019221519
VL - 56
SP - 4168
EP - 4179
JO - Applied Optics
JF - Applied Optics
SN - 1559-128X
IS - 14
ER -