Details
Originalsprache | Englisch |
---|---|
Seiten (von - bis) | 302-308 |
Fachzeitschrift | 3RD INTERNATIONAL CONFERENCE ON SYSTEM-INTEGRATED INTELLIGENCE: NEW CHALLENGES FOR PRODUCT AND PRODUCTION ENGINEERING |
Jahrgang | 26 |
Publikationsstatus | Veröffentlicht - 1 Okt. 2016 |
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
in: 3RD INTERNATIONAL CONFERENCE ON SYSTEM-INTEGRATED INTELLIGENCE: NEW CHALLENGES FOR PRODUCT AND PRODUCTION ENGINEERING, Jahrgang 26, 01.10.2016, S. 302-308.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Autonomous Modular Process Monitoring
AU - Denkena, Berend
AU - Dahlmann, Dominik
AU - Neff, Thomas
PY - 2016/10/1
Y1 - 2016/10/1
KW - Process Monitoring
KW - Process Segmentation
KW - Economic Production
KW - Manageability
U2 - 10.1016/j.protcy.2016.08.039
DO - 10.1016/j.protcy.2016.08.039
M3 - Article
VL - 26
SP - 302
EP - 308
JO - 3RD INTERNATIONAL CONFERENCE ON SYSTEM-INTEGRATED INTELLIGENCE: NEW CHALLENGES FOR PRODUCT AND PRODUCTION ENGINEERING
JF - 3RD INTERNATIONAL CONFERENCE ON SYSTEM-INTEGRATED INTELLIGENCE: NEW CHALLENGES FOR PRODUCT AND PRODUCTION ENGINEERING
SN - 2212-0173
ER -