Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Malgorzata Rechmal-Lesse
  • Gerald Alexander Koroa
  • Yeremia Gunawan Adhisantoso
  • Markus Olbrich
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Details

OriginalspracheEnglisch
Titel des Sammelwerks2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)
Seiten66-69
Seitenumfang4
ISBN (elektronisch)9781728170442
PublikationsstatusVeröffentlicht - 2020

Abstract

With the advancements in analog/mixed-signal (AMS) systems and continuously shrinking design sizes, there is an increased demand for reliable verification to ensure correct behavior. To overcome this obstacle, using formal verification is a promising option. We present a modeling system that automatically provides dependable set-valued models from circuit netlists in a form suitable for reachability analysis. Our method is based on local linearizations of the nonlinear circuit. Linearized locations are computed on-the-fly depending on which states are reachable to avoid the state-space explosion problem. The set-valued models include device parameter variations, modeling errors and uncertain input stimuli.

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Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. / Rechmal-Lesse, Malgorzata; Koroa, Gerald Alexander; Adhisantoso, Yeremia Gunawan et al.
2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). 2020. S. 66-69 9159822.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Rechmal-Lesse, M, Koroa, GA, Adhisantoso, YG & Olbrich, M 2020, Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. in 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)., 9159822, S. 66-69. https://doi.org/10.1109/newcas49341.2020.9159822
Rechmal-Lesse, M., Koroa, G. A., Adhisantoso, Y. G., & Olbrich, M. (2020). Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. In 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) (S. 66-69). Artikel 9159822 https://doi.org/10.1109/newcas49341.2020.9159822
Rechmal-Lesse M, Koroa GA, Adhisantoso YG, Olbrich M. Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. in 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). 2020. S. 66-69. 9159822 doi: 10.1109/newcas49341.2020.9159822
Rechmal-Lesse, Malgorzata ; Koroa, Gerald Alexander ; Adhisantoso, Yeremia Gunawan et al. / Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits. 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). 2020. S. 66-69
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@inproceedings{5cffd818a7a94a379a7210cb3e3694cd,
title = "Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits.",
abstract = "With the advancements in analog/mixed-signal (AMS) systems and continuously shrinking design sizes, there is an increased demand for reliable verification to ensure correct behavior. To overcome this obstacle, using formal verification is a promising option. We present a modeling system that automatically provides dependable set-valued models from circuit netlists in a form suitable for reachability analysis. Our method is based on local linearizations of the nonlinear circuit. Linearized locations are computed on-the-fly depending on which states are reachable to avoid the state-space explosion problem. The set-valued models include device parameter variations, modeling errors and uncertain input stimuli.",
keywords = "Formal verification, Nonlinear analog circuit, Piecewise linear model, Reachability analysis, Uncertainties",
author = "Malgorzata Rechmal-Lesse and Koroa, {Gerald Alexander} and Adhisantoso, {Yeremia Gunawan} and Markus Olbrich",
note = "Funding information: The authors gratefully acknowledge financial support by the German Research Foundation (DFG) under project number 286525601",
year = "2020",
doi = "10.1109/newcas49341.2020.9159822",
language = "English",
isbn = "978-1-7281-7045-9",
pages = "66--69",
booktitle = "2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)",

}

Download

TY - GEN

T1 - Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits.

AU - Rechmal-Lesse, Malgorzata

AU - Koroa, Gerald Alexander

AU - Adhisantoso, Yeremia Gunawan

AU - Olbrich, Markus

N1 - Funding information: The authors gratefully acknowledge financial support by the German Research Foundation (DFG) under project number 286525601

PY - 2020

Y1 - 2020

N2 - With the advancements in analog/mixed-signal (AMS) systems and continuously shrinking design sizes, there is an increased demand for reliable verification to ensure correct behavior. To overcome this obstacle, using formal verification is a promising option. We present a modeling system that automatically provides dependable set-valued models from circuit netlists in a form suitable for reachability analysis. Our method is based on local linearizations of the nonlinear circuit. Linearized locations are computed on-the-fly depending on which states are reachable to avoid the state-space explosion problem. The set-valued models include device parameter variations, modeling errors and uncertain input stimuli.

AB - With the advancements in analog/mixed-signal (AMS) systems and continuously shrinking design sizes, there is an increased demand for reliable verification to ensure correct behavior. To overcome this obstacle, using formal verification is a promising option. We present a modeling system that automatically provides dependable set-valued models from circuit netlists in a form suitable for reachability analysis. Our method is based on local linearizations of the nonlinear circuit. Linearized locations are computed on-the-fly depending on which states are reachable to avoid the state-space explosion problem. The set-valued models include device parameter variations, modeling errors and uncertain input stimuli.

KW - Formal verification

KW - Nonlinear analog circuit

KW - Piecewise linear model

KW - Reachability analysis

KW - Uncertainties

UR - http://www.scopus.com/inward/record.url?scp=85091344917&partnerID=8YFLogxK

U2 - 10.1109/newcas49341.2020.9159822

DO - 10.1109/newcas49341.2020.9159822

M3 - Conference contribution

SN - 978-1-7281-7045-9

SP - 66

EP - 69

BT - 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)

ER -