Atomic photoexcitation as a tool for probing purity of twisted light modes

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • R. P. Schmidt
  • S. Ramakrishna
  • A. A. Peshkov
  • N. Huntemann
  • E. Peik
  • S. Fritzsche
  • A. Surzhykov

Externe Organisationen

  • Physikalisch-Technische Bundesanstalt (PTB)
  • Technische Universität Braunschweig
  • Helmholtz-Institut Jena
  • GSI Helmholtzzentrum für Schwerionenforschung GmbH
  • Friedrich-Schiller-Universität Jena
  • Laboratory for Emerging Nanometrology Braunschweig (LENA)
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Details

OriginalspracheEnglisch
Aufsatznummer033103
FachzeitschriftPhysical Review A
Jahrgang109
Ausgabenummer3
PublikationsstatusVeröffentlicht - 4 März 2024
Extern publiziertJa

Abstract

The twisted light modes used in modern atomic physics experiments can be contaminated by small admixtures of plane-wave radiation. Although these admixtures hardly reveal themselves in the beam-intensity profile, they may seriously affect the outcome of high-precision spectroscopy measurements. In the present study we propose a method for diagnosing such a plane-wave contamination which is based on the analysis of the magnetic sublevel population of atoms or ions interacting with the "twisted + plane-wave"radiation. In order to theoretically investigate the sublevel populations, we solve the Liouville-von Neumann equation for the time evolution of the atomic density matrix. The proposed method is illustrated for the electric dipole 5sS1/22-5pP3/22 transition in Rb induced by (linearly, radially, or azimuthally polarized) vortex light with just a small contamination. We find that even tiny admixtures of plane-wave radiation can lead to remarkable variations in the populations of the ground-state magnetic sublevels. This opens up new opportunities for diagnostics of twisted light in atomic spectroscopy experiments.

ASJC Scopus Sachgebiete

Zitieren

Atomic photoexcitation as a tool for probing purity of twisted light modes. / Schmidt, R. P.; Ramakrishna, S.; Peshkov, A. A. et al.
in: Physical Review A, Jahrgang 109, Nr. 3, 033103, 04.03.2024.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Schmidt, RP, Ramakrishna, S, Peshkov, AA, Huntemann, N, Peik, E, Fritzsche, S & Surzhykov, A 2024, 'Atomic photoexcitation as a tool for probing purity of twisted light modes', Physical Review A, Jg. 109, Nr. 3, 033103. https://doi.org/10.1103/PhysRevA.109.033103
Schmidt, R. P., Ramakrishna, S., Peshkov, A. A., Huntemann, N., Peik, E., Fritzsche, S., & Surzhykov, A. (2024). Atomic photoexcitation as a tool for probing purity of twisted light modes. Physical Review A, 109(3), Artikel 033103. https://doi.org/10.1103/PhysRevA.109.033103
Schmidt RP, Ramakrishna S, Peshkov AA, Huntemann N, Peik E, Fritzsche S et al. Atomic photoexcitation as a tool for probing purity of twisted light modes. Physical Review A. 2024 Mär 4;109(3):033103. doi: 10.1103/PhysRevA.109.033103
Schmidt, R. P. ; Ramakrishna, S. ; Peshkov, A. A. et al. / Atomic photoexcitation as a tool for probing purity of twisted light modes. in: Physical Review A. 2024 ; Jahrgang 109, Nr. 3.
Download
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AU - Huntemann, N.

AU - Peik, E.

AU - Fritzsche, S.

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