TY - JOUR

T1 - Assessment of the actual condition of the electrical components in medium-voltage networks

AU - Zhang, X.

AU - Gockenbach, Ernst

N1 - Funding Information: Manuscript received June 27, 2005; revised October 26, 2005. This work was supported by the National Research Council of Germany under Contract Go 558/8-1. Associate Editor: J. Kharoufeh. The authors are with the Institute of Electric Power Systems, Division of High Voltage Engineering, University of Hanover, Hanover 30167, Germany (e-mail: zhang@si.uni-hannover.de). Digital Object Identifier 10.1109/TR.2006.874935

PY - 2006/6

Y1 - 2006/6

N2 - Due to the large amount of electrical equipment and the costs of an individual diagnosis in medium-voltage networks, a general consideration of some representative electrical components is necessary to assess the actual condition of the electrical equipment. For a life model of electrical components, the individual aging phenomena of representative electrical components, as well as the general aging mechanisms of insulating materials, are taken into account in this paper. The aging of insulating materials can be estimated by an electrical breakdown occurring in electrical components so that the relationship between lifetime and failure probability of electrical components may be studied using the life model, the probabilistic failure model, and the enlargement law which are reasonably able to investigate the cause & consequence of failure in medium-voltage networks. Thereby, a new approach is developed for the assessment of the actual condition of electrical components in terms of failure time, failure probability, hazard rate, and other related variables of electrical components in medium-voltage networks. These reliability issues will support the decision-making in future deregulation of the electric energy market. Furthermore the model is verified through some electrical components like conductors, cables, transformers, and circuit-breakers with their specific failure statistics. It is demonstrated that the method is able to assess the actual condition of electrical components in medium-voltage networks with reasonable, accurate data.

AB - Due to the large amount of electrical equipment and the costs of an individual diagnosis in medium-voltage networks, a general consideration of some representative electrical components is necessary to assess the actual condition of the electrical equipment. For a life model of electrical components, the individual aging phenomena of representative electrical components, as well as the general aging mechanisms of insulating materials, are taken into account in this paper. The aging of insulating materials can be estimated by an electrical breakdown occurring in electrical components so that the relationship between lifetime and failure probability of electrical components may be studied using the life model, the probabilistic failure model, and the enlargement law which are reasonably able to investigate the cause & consequence of failure in medium-voltage networks. Thereby, a new approach is developed for the assessment of the actual condition of electrical components in terms of failure time, failure probability, hazard rate, and other related variables of electrical components in medium-voltage networks. These reliability issues will support the decision-making in future deregulation of the electric energy market. Furthermore the model is verified through some electrical components like conductors, cables, transformers, and circuit-breakers with their specific failure statistics. It is demonstrated that the method is able to assess the actual condition of electrical components in medium-voltage networks with reasonable, accurate data.

KW - Actual condition

KW - Assessment

KW - Electrical component

KW - Failure probability

KW - Hazard rate

KW - Medium-voltage network

KW - Probabilistic failure density

UR - http://www.scopus.com/inward/record.url?scp=33745199870&partnerID=8YFLogxK

U2 - 10.1109/TR.2006.874935

DO - 10.1109/TR.2006.874935

M3 - Article

AN - SCOPUS:33745199870

VL - 55

SP - 361

EP - 368

JO - IEEE transactions on reliability

JF - IEEE transactions on reliability

SN - 0018-9529

IS - 2

ER -