Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2015 IEEE International Symposium on Electromagnetic Compatibility |
| Untertitel | EMC |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 1083-1088 |
| Seitenumfang | 6 |
| ISBN (elektronisch) | 9781479966158 |
| Publikationsstatus | Veröffentlicht - 2015 |
| Veranstaltung | IEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Deutschland Dauer: 16 Aug. 2015 → 22 Aug. 2015 |
Publikationsreihe
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| Band | 2015-Septmber |
| ISSN (Print) | 1077-4076 |
| ISSN (elektronisch) | 2158-1118 |
Abstract
This paper discusses a technique which enables the assessment of key parameter of various intentional electromagnetic environments (IEME) for electronic systems, including the likelihood of their occurrence. The technique starts with a categorization of aspects, including non-technical aspects like availability of components, required knowledge and costs. Based on this categorization the likelihood that an offender has access to such an IEMI source is determined by a heuristic approach. In a second assessment step the possibility that a considered IEMI source might occur in the ambient of a given target system as well as parameters of the generated IEME are estimated.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
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2015 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2015. S. 1083-1088 7256319 (IEEE International Symposium on Electromagnetic Compatibility; Band 2015-Septmber).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Assessing the Likelihood of Various Intentional Electromagnetic Environments
T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
AU - Sabath, Frank
AU - Garbe, Heyno
PY - 2015
Y1 - 2015
N2 - This paper discusses a technique which enables the assessment of key parameter of various intentional electromagnetic environments (IEME) for electronic systems, including the likelihood of their occurrence. The technique starts with a categorization of aspects, including non-technical aspects like availability of components, required knowledge and costs. Based on this categorization the likelihood that an offender has access to such an IEMI source is determined by a heuristic approach. In a second assessment step the possibility that a considered IEMI source might occur in the ambient of a given target system as well as parameters of the generated IEME are estimated.
AB - This paper discusses a technique which enables the assessment of key parameter of various intentional electromagnetic environments (IEME) for electronic systems, including the likelihood of their occurrence. The technique starts with a categorization of aspects, including non-technical aspects like availability of components, required knowledge and costs. Based on this categorization the likelihood that an offender has access to such an IEMI source is determined by a heuristic approach. In a second assessment step the possibility that a considered IEMI source might occur in the ambient of a given target system as well as parameters of the generated IEME are estimated.
KW - assessment
KW - categorisation
KW - EM environment
KW - IEMI source
KW - intentional electromagnetic interference (IEMI)
KW - likelihood of occurance
UR - http://www.scopus.com/inward/record.url?scp=84953858527&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2015.7256319
DO - 10.1109/ISEMC.2015.7256319
M3 - Conference contribution
AN - SCOPUS:84953858527
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 1083
EP - 1088
BT - 2015 IEEE International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 16 August 2015 through 22 August 2015
ER -