Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2008 IEEE International Symposium on Electromagnetic Compatibility |
| Untertitel | EMC |
| Publikationsstatus | Veröffentlicht - 2008 |
| Veranstaltung | 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, USA / Vereinigte Staaten Dauer: 18 Aug. 2008 → 22 Aug. 2008 |
Publikationsreihe
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| ISSN (Print) | 1077-4076 |
Abstract
This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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2008 IEEE International Symposium on Electromagnetic Compatibility: EMC. 2008. (IEEE International Symposium on Electromagnetic Compatibility).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Aspects of Using the IEC 61000-4-20 for Transient Testing with Broadband Signals
AU - Thye, Holger
AU - Zamow, Dirk
AU - Koch, Michael
AU - Garbe, Heyno
PY - 2008
Y1 - 2008
N2 - This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
AB - This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
KW - IEC 61000-4-20
KW - Transient measurements
KW - Ultra wideband signal
UR - http://www.scopus.com/inward/record.url?scp=84890602585&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2008.4652025
DO - 10.1109/ISEMC.2008.4652025
M3 - Conference contribution
AN - SCOPUS:84890602585
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - 2008 IEEE International Symposium on Electromagnetic Compatibility
T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008
Y2 - 18 August 2008 through 22 August 2008
ER -