Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 1556-1557 |
| Seitenumfang | 2 |
| Fachzeitschrift | Journal of the Optical Society of America |
| Jahrgang | 72 |
| Ausgabenummer | 11 |
| Publikationsstatus | Veröffentlicht - 1 Nov. 1982 |
Abstract
Branching ratios have been obtained for 33 lines originating from nine levels in Ar II by Fourier spectroscopic measurements on a high-current hollow cathode. The values are compared with recent literature data.
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in: Journal of the Optical Society of America, Jahrgang 72, Nr. 11, 01.11.1982, S. 1556-1557.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Argon branching ratios for spectral intensity calibration
T2 - a reply
AU - Danzmann, K.
AU - Kock, M.
PY - 1982/11/1
Y1 - 1982/11/1
N2 - Branching ratios have been obtained for 33 lines originating from nine levels in Ar II by Fourier spectroscopic measurements on a high-current hollow cathode. The values are compared with recent literature data.
AB - Branching ratios have been obtained for 33 lines originating from nine levels in Ar II by Fourier spectroscopic measurements on a high-current hollow cathode. The values are compared with recent literature data.
UR - http://www.scopus.com/inward/record.url?scp=0020205353&partnerID=8YFLogxK
U2 - 10.1364/JOSA.72.001556
DO - 10.1364/JOSA.72.001556
M3 - Article
AN - SCOPUS:0020205353
VL - 72
SP - 1556
EP - 1557
JO - Journal of the Optical Society of America
JF - Journal of the Optical Society of America
SN - 0030-3941
IS - 11
ER -