TY - JOUR

T1 - Application of Dual-Polarimetry SAR Images in Multitemporal InSAR Processing

AU - Esmaeili, Mostafa

AU - Motagh, Mahdi

AU - Hooper, Andy

N1 - Publisher Copyright: © 2004-2012 IEEE. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2017/9

Y1 - 2017/9

N2 - Multitemporal polarimetric synthetic aperture radar (SAR) data can be used to estimate the dominant scattering mechanism of targets in a stack of SAR data and to improve the performance of SAR interferometric methods for deformation studies. In this letter, we developed a polarimetric form of amplitude difference dispersion (ADD) criterion for time-series analysis of pixels in which interferometric noise shows negligible decorrelation in time and space in small baseline algorithm. The polarimetric form of ADD is then optimized in order to find the optimum scattering mechanism of the pixels, which in turn is used to produce new interferograms with better quality than single-pol SAR interferograms. The selected candidates are then combined with temporal coherency criterion for final phase stability analysis in full-resolution interferograms. Our experimental results derived from a data set of 17 dual polarizations X-band SAR images (HH/VV) acquired by TerraSAR-X shows that using optimum scattering mechanism in the small baseline method improves the number of pixel candidates for deformation analysis by about 2.5 times in comparison with the results obtained from single-channel SAR data. The number of final pixels increases by about 1.5 times in comparison with HH and VV in small baseline analysis. Comparison between persistent scatterer (PS) and small baseline methods shows that with regards to the number of pixels with optimum scattering mechanism, the small baseline algorithm detects 10% more pixels than PS in agricultural regions. In urban regions, however, the PS method identifies nearly 8% more coherent pixels than small baseline approach.

AB - Multitemporal polarimetric synthetic aperture radar (SAR) data can be used to estimate the dominant scattering mechanism of targets in a stack of SAR data and to improve the performance of SAR interferometric methods for deformation studies. In this letter, we developed a polarimetric form of amplitude difference dispersion (ADD) criterion for time-series analysis of pixels in which interferometric noise shows negligible decorrelation in time and space in small baseline algorithm. The polarimetric form of ADD is then optimized in order to find the optimum scattering mechanism of the pixels, which in turn is used to produce new interferograms with better quality than single-pol SAR interferograms. The selected candidates are then combined with temporal coherency criterion for final phase stability analysis in full-resolution interferograms. Our experimental results derived from a data set of 17 dual polarizations X-band SAR images (HH/VV) acquired by TerraSAR-X shows that using optimum scattering mechanism in the small baseline method improves the number of pixel candidates for deformation analysis by about 2.5 times in comparison with the results obtained from single-channel SAR data. The number of final pixels increases by about 1.5 times in comparison with HH and VV in small baseline analysis. Comparison between persistent scatterer (PS) and small baseline methods shows that with regards to the number of pixels with optimum scattering mechanism, the small baseline algorithm detects 10% more pixels than PS in agricultural regions. In urban regions, however, the PS method identifies nearly 8% more coherent pixels than small baseline approach.

KW - Amplitude difference dispersion (ADD)

KW - polarimetric optimization

KW - slowly decorrelating filtered phase (SDFP)

KW - Tehran plain

UR - http://www.scopus.com/inward/record.url?scp=85028812311&partnerID=8YFLogxK

U2 - 10.1109/LGRS.2017.2717846

DO - 10.1109/LGRS.2017.2717846

M3 - Article

AN - SCOPUS:85028812311

VL - 14

SP - 1489

EP - 1493

JO - IEEE Geoscience and Remote Sensing Letters

JF - IEEE Geoscience and Remote Sensing Letters

SN - 1545-598X

IS - 9

M1 - 7984796

ER -