Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Autoren

  • Matthias Winter
  • Malte R. Vogt
  • Karsten Bothe
  • Marc Köntges
  • Rolf Brendel
  • Pietro P. Altermatt
  • Hendrik Holst

Organisationseinheiten

Externe Organisationen

  • Institut für Solarenergieforschung GmbH (ISFH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)86-93
Seitenumfang8
FachzeitschriftEnergy Procedia
Jahrgang38
Frühes Online-Datum5 Sept. 2013
PublikationsstatusVeröffentlicht - 2013
Veranstaltung3rd International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2013 - Hamelin, Deutschland
Dauer: 25 März 201327 März 2013

Abstract

While ray tracing of solar cells was established decades ago, ray tracing of entire modules has met obstacles, mainly because module optics are affected by geometric structures varying over a large scale of dimensions. In this paper, we introduce a ray tracing framework that is based on a modular structure made up of separate plugins. While existing plugins can be used for common effects such as light sources, absorption in materials, etc., specialized plug-ins can be written by users to handle problem-specific properties. We demonstrate the functionality of our approach by ray tracing a test module containing 9 crystalline Si solar cells. Good agreement between light-beam induced current (LBIC) measurements and ray tracing is achieved.

ASJC Scopus Sachgebiete

Zitieren

Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules. / Winter, Matthias; Vogt, Malte R.; Bothe, Karsten et al.
in: Energy Procedia, Jahrgang 38, 2013, S. 86-93.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Winter, M, Vogt, MR, Bothe, K, Köntges, M, Brendel, R, Altermatt, PP & Holst, H 2013, 'Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules', Energy Procedia, Jg. 38, S. 86-93. https://doi.org/10.1016/j.egypro.2013.07.253
Winter, M., Vogt, M. R., Bothe, K., Köntges, M., Brendel, R., Altermatt, P. P., & Holst, H. (2013). Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules. Energy Procedia, 38, 86-93. https://doi.org/10.1016/j.egypro.2013.07.253
Winter M, Vogt MR, Bothe K, Köntges M, Brendel R, Altermatt PP et al. Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules. Energy Procedia. 2013;38:86-93. Epub 2013 Sep 5. doi: 10.1016/j.egypro.2013.07.253
Winter, Matthias ; Vogt, Malte R. ; Bothe, Karsten et al. / Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules. in: Energy Procedia. 2013 ; Jahrgang 38. S. 86-93.
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AU - Bothe, Karsten

AU - Köntges, Marc

AU - Brendel, Rolf

AU - Altermatt, Pietro P.

AU - Holst, Hendrik

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