Antifungal Susceptibility Testing of Aspergillus Niger on Silicon Microwells by Intensity-Based Reflectometric Interference Spectroscopy

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Christopher Heuer
  • Heidi Leonard
  • Nadav Nitzan
  • Ariella Lavy-Alperovitch
  • Naama Massad-Ivanir
  • Thomas Scheper
  • Ester Segal

Organisationseinheiten

Externe Organisationen

  • Technion-Israel Institute of Technology
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Details

OriginalspracheEnglisch
Seiten (von - bis)2560-2566
Seitenumfang7
FachzeitschriftACS infectious diseases
Jahrgang6
Ausgabenummer10
Frühes Online-Datum15 Sept. 2020
PublikationsstatusVeröffentlicht - 9 Okt. 2020

Abstract

There is a demonstrated and paramount need for rapid, reliable infectious disease diagnostics, particularly those for invasive fungal infections. Current clinical determinations for an appropriate antifungal therapy can take up to 3 days using current antifungal susceptibility testing methods, a time-to-readout that can prove detrimental for immunocompromised patients and promote the spread of antifungal resistant pathogens. Herein, we demonstrate the application of intensity-based reflectometric interference spectroscopic measurements (termed iPRISM) on microstructured silicon sensors for use as a rapid, phenotypic antifungal susceptibility test. This diagnostic platform optically tracks morphological changes of fungi corresponding to conidia growth and hyphal colonization at a solid-liquid interface in real time. Using Aspergillus niger as a model fungal pathogen, we can determine the minimal inhibitory concentration of clinically relevant antifungals within 12 h. This assay allows for expedited detection of fungal growth and provides a label-free alternative to broth microdilution and agar diffusion methods, with the potential to be used for point-of-care diagnostics.

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Antifungal Susceptibility Testing of Aspergillus Niger on Silicon Microwells by Intensity-Based Reflectometric Interference Spectroscopy. / Heuer, Christopher; Leonard, Heidi; Nitzan, Nadav et al.
in: ACS infectious diseases, Jahrgang 6, Nr. 10, 09.10.2020, S. 2560-2566.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Heuer C, Leonard H, Nitzan N, Lavy-Alperovitch A, Massad-Ivanir N, Scheper T et al. Antifungal Susceptibility Testing of Aspergillus Niger on Silicon Microwells by Intensity-Based Reflectometric Interference Spectroscopy. ACS infectious diseases. 2020 Okt 9;6(10):2560-2566. Epub 2020 Sep 15. doi: 10.1021/acsinfecdis.0c00234
Heuer, Christopher ; Leonard, Heidi ; Nitzan, Nadav et al. / Antifungal Susceptibility Testing of Aspergillus Niger on Silicon Microwells by Intensity-Based Reflectometric Interference Spectroscopy. in: ACS infectious diseases. 2020 ; Jahrgang 6, Nr. 10. S. 2560-2566.
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abstract = "There is a demonstrated and paramount need for rapid, reliable infectious disease diagnostics, particularly those for invasive fungal infections. Current clinical determinations for an appropriate antifungal therapy can take up to 3 days using current antifungal susceptibility testing methods, a time-to-readout that can prove detrimental for immunocompromised patients and promote the spread of antifungal resistant pathogens. Herein, we demonstrate the application of intensity-based reflectometric interference spectroscopic measurements (termed iPRISM) on microstructured silicon sensors for use as a rapid, phenotypic antifungal susceptibility test. This diagnostic platform optically tracks morphological changes of fungi corresponding to conidia growth and hyphal colonization at a solid-liquid interface in real time. Using Aspergillus niger as a model fungal pathogen, we can determine the minimal inhibitory concentration of clinically relevant antifungals within 12 h. This assay allows for expedited detection of fungal growth and provides a label-free alternative to broth microdilution and agar diffusion methods, with the potential to be used for point-of-care diagnostics.",
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