Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 203-208 |
| Seitenumfang | 6 |
| ISBN (Print) | 9781479932993 |
| Publikationsstatus | Veröffentlicht - 2013 |
| Veranstaltung | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, USA / Vereinigte Staaten Dauer: 16 Juni 2013 → 21 Juni 2013 |
Publikationsreihe
| Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
|---|---|
| ISSN (Print) | 0160-8371 |
Abstract
We present an analytical expression for modelling electroluminescence (EL) as well as photoluminescence (PL) data of samples with any combination of planar and arbitrary rough surfaces. The model also accounts for free carrier absorption in highly doped regions of the sample. It is experimentally confirmed by comparison to measured EL and PL spectra of solar cells and wafers featuring different surface geometries. Significant differences in the absorption coefficient data available from literature, which enters the model as tabulated data, are revealed. Using our model, the absorption data by Daub yields the best agreement to the measured luminescence spectra. Moreover, we present a method to determine the rear surface reflectance of samples from the peak wavelength of luminescence spectra.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Steuerungs- und Systemtechnik
- Ingenieurwesen (insg.)
- Wirtschaftsingenieurwesen und Fertigungstechnik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
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39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. S. 203-208 6744131 (Conference Record of the IEEE Photovoltaic Specialists Conference).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Analyzing the spectral luminescence emission of silicon solar cells and wafers
AU - Schinke, Carsten
AU - Hinken, David
AU - Bothe, Karsten
AU - Schmidt, Jan
AU - Brendel, Rolf
PY - 2013
Y1 - 2013
N2 - We present an analytical expression for modelling electroluminescence (EL) as well as photoluminescence (PL) data of samples with any combination of planar and arbitrary rough surfaces. The model also accounts for free carrier absorption in highly doped regions of the sample. It is experimentally confirmed by comparison to measured EL and PL spectra of solar cells and wafers featuring different surface geometries. Significant differences in the absorption coefficient data available from literature, which enters the model as tabulated data, are revealed. Using our model, the absorption data by Daub yields the best agreement to the measured luminescence spectra. Moreover, we present a method to determine the rear surface reflectance of samples from the peak wavelength of luminescence spectra.
AB - We present an analytical expression for modelling electroluminescence (EL) as well as photoluminescence (PL) data of samples with any combination of planar and arbitrary rough surfaces. The model also accounts for free carrier absorption in highly doped regions of the sample. It is experimentally confirmed by comparison to measured EL and PL spectra of solar cells and wafers featuring different surface geometries. Significant differences in the absorption coefficient data available from literature, which enters the model as tabulated data, are revealed. Using our model, the absorption data by Daub yields the best agreement to the measured luminescence spectra. Moreover, we present a method to determine the rear surface reflectance of samples from the peak wavelength of luminescence spectra.
KW - Charge carrier distribution
KW - Luminescence
KW - Photon escape probability
UR - http://www.scopus.com/inward/record.url?scp=84896470785&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2013.6744131
DO - 10.1109/PVSC.2013.6744131
M3 - Conference contribution
AN - SCOPUS:84896470785
SN - 9781479932993
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 203
EP - 208
BT - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Y2 - 16 June 2013 through 21 June 2013
ER -