Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Proceedings of the 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013 |
| Seiten | 185-190 |
| Seitenumfang | 6 |
| Publikationsstatus | Veröffentlicht - 2013 |
| Veranstaltung | 2013 International Symposium on Electromagnetic Compatibility: EMC Europe 2013 - Brugge, Belgien Dauer: 2 Sept. 2013 → 6 Sept. 2013 |
Publikationsreihe
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| ISSN (Print) | 1077-4076 |
| ISSN (elektronisch) | 2158-1118 |
Abstract
This paper deals with the TEM cross-correlation method (TCCM) to qualify and characterize transverse electromagnetic (TEM) waveguides for arbitrary transient signals. In previous papers the applicability of the TCCM to waveguides was shown. The aim of this investigation is to apply the established limits of the various standards (e.g. the IEC 61000-4-20 Annex C) to this new method and determine the sensitivity of the TCCM.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
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Proceedings of the 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013. 2013. S. 185-190 6653225 (IEEE International Symposium on Electromagnetic Compatibility).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Analysis of the sensitivity for the TEM cross-correlation method to qualify TEM-waveguides for UWB measurements
AU - Koelling, Christian
AU - Garbe, Heyno
AU - Potthast, Stefan
PY - 2013
Y1 - 2013
N2 - This paper deals with the TEM cross-correlation method (TCCM) to qualify and characterize transverse electromagnetic (TEM) waveguides for arbitrary transient signals. In previous papers the applicability of the TCCM to waveguides was shown. The aim of this investigation is to apply the established limits of the various standards (e.g. the IEC 61000-4-20 Annex C) to this new method and determine the sensitivity of the TCCM.
AB - This paper deals with the TEM cross-correlation method (TCCM) to qualify and characterize transverse electromagnetic (TEM) waveguides for arbitrary transient signals. In previous papers the applicability of the TCCM to waveguides was shown. The aim of this investigation is to apply the established limits of the various standards (e.g. the IEC 61000-4-20 Annex C) to this new method and determine the sensitivity of the TCCM.
KW - Cross-correlation
KW - GTEM-cell
KW - IEC 61000-4-20
KW - Sensitivity
KW - TCCM
KW - TEM waveguide
KW - Transient measurement
UR - http://www.scopus.com/inward/record.url?scp=84890744139&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84890744139
SN - 9781467349796
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 185
EP - 190
BT - Proceedings of the 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
T2 - 2013 International Symposium on Electromagnetic Compatibility
Y2 - 2 September 2013 through 6 September 2013
ER -