Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials |
| Untertitel | 2014 |
| Herausgeber (Verlag) | SPIE |
| ISBN (elektronisch) | 9781628413007 |
| Publikationsstatus | Veröffentlicht - 13 Okt. 2014 |
| Extern publiziert | Ja |
| Veranstaltung | 46th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials: 2014 - Boulder, USA / Vereinigte Staaten Dauer: 14 Sept. 2014 → 17 Sept. 2014 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Band | 9237 |
| ISSN (Print) | 0277-786X |
| ISSN (elektronisch) | 1996-756X |
Abstract
This paper reports on the analysis of laser damage measurements made on an entire lot of approximately identically processed and coated samples. Each sample's test data is analyzed to determine its probability of damage curve, pi(φ). The probability of damage curves are further processed to derive the defect distribution, fi(φ), for each sample. The individual fi(φ) are then examined to determine if they are likely to have come from a single parent distribution, f(φ), which represents the performance of the manufacturing process.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
Zitieren
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- BibTex
- RIS
46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2014. SPIE, 2014. 923724 (Proceedings of SPIE - The International Society for Optical Engineering; Band 9237).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Analysis of the laser damage characteristics of a production lot
AU - Arenberg, Jonathan W.
AU - Jensen, Lars O.
AU - Ristau, Detlev
PY - 2014/10/13
Y1 - 2014/10/13
N2 - This paper reports on the analysis of laser damage measurements made on an entire lot of approximately identically processed and coated samples. Each sample's test data is analyzed to determine its probability of damage curve, pi(φ). The probability of damage curves are further processed to derive the defect distribution, fi(φ), for each sample. The individual fi(φ) are then examined to determine if they are likely to have come from a single parent distribution, f(φ), which represents the performance of the manufacturing process.
AB - This paper reports on the analysis of laser damage measurements made on an entire lot of approximately identically processed and coated samples. Each sample's test data is analyzed to determine its probability of damage curve, pi(φ). The probability of damage curves are further processed to derive the defect distribution, fi(φ), for each sample. The individual fi(φ) are then examined to determine if they are likely to have come from a single parent distribution, f(φ), which represents the performance of the manufacturing process.
KW - Binary search technique
KW - Damage frequency method
KW - Lot testing
KW - Maximum likelihood
UR - http://www.scopus.com/inward/record.url?scp=84923003932&partnerID=8YFLogxK
U2 - 10.1117/12.2068336
DO - 10.1117/12.2068336
M3 - Conference contribution
AN - SCOPUS:84923003932
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials
PB - SPIE
T2 - 46th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials: 2014
Y2 - 14 September 2014 through 17 September 2014
ER -