An Overview of Modified Semiparametric Memory Estimation Methods

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autorschaft

  • Marie Busch
  • Philipp Sibbertsen

Organisationseinheiten

Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer13
FachzeitschriftEconometrics
Jahrgang6
Ausgabenummer1
PublikationsstatusVeröffentlicht - 12 März 2018

Abstract

Several modified estimation methods of the memory parameter have been introduced in the past years. They aim to decrease the upward bias of the memory parameter in cases of low frequency contaminations or an additive noise component, especially in situations with a short-memory process being contaminated. In this paper, we provide an overview and compare the performance of nine semiparametric estimation methods. Among them are two standard methods, four modified approaches to account for low frequency contaminations and three procedures developed for perturbed fractional processes. We conduct an extensive Monte Carlo study for a variety of parameter constellations and several DGPs. Furthermore, an empirical application of the log-absolute return series of the S&P 500 shows that the estimation results combined with a long-memory test indicate a spurious long-memory process.

ASJC Scopus Sachgebiete

Zitieren

An Overview of Modified Semiparametric Memory Estimation Methods. / Busch, Marie; Sibbertsen, Philipp.
in: Econometrics, Jahrgang 6, Nr. 1, 13, 12.03.2018.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Busch M, Sibbertsen P. An Overview of Modified Semiparametric Memory Estimation Methods. Econometrics. 2018 Mär 12;6(1):13. doi: 10.3390/econometrics6010013, 10.15488/4288
Busch, Marie ; Sibbertsen, Philipp. / An Overview of Modified Semiparametric Memory Estimation Methods. in: Econometrics. 2018 ; Jahrgang 6, Nr. 1.
Download
@article{b0bf5d6b20914c07aac027f76b090951,
title = "An Overview of Modified Semiparametric Memory Estimation Methods",
abstract = "Several modified estimation methods of the memory parameter have been introduced in the past years. They aim to decrease the upward bias of the memory parameter in cases of low frequency contaminations or an additive noise component, especially in situations with a short-memory process being contaminated. In this paper, we provide an overview and compare the performance of nine semiparametric estimation methods. Among them are two standard methods, four modified approaches to account for low frequency contaminations and three procedures developed for perturbed fractional processes. We conduct an extensive Monte Carlo study for a variety of parameter constellations and several DGPs. Furthermore, an empirical application of the log-absolute return series of the S&P 500 shows that the estimation results combined with a long-memory test indicate a spurious long-memory process.",
keywords = "Low frequency contamination, Monte Carlo simulation, Perturbation, Semiparametric estimation, Spurious long memory",
author = "Marie Busch and Philipp Sibbertsen",
year = "2018",
month = mar,
day = "12",
doi = "10.3390/econometrics6010013",
language = "English",
volume = "6",
number = "1",

}

Download

TY - JOUR

T1 - An Overview of Modified Semiparametric Memory Estimation Methods

AU - Busch, Marie

AU - Sibbertsen, Philipp

PY - 2018/3/12

Y1 - 2018/3/12

N2 - Several modified estimation methods of the memory parameter have been introduced in the past years. They aim to decrease the upward bias of the memory parameter in cases of low frequency contaminations or an additive noise component, especially in situations with a short-memory process being contaminated. In this paper, we provide an overview and compare the performance of nine semiparametric estimation methods. Among them are two standard methods, four modified approaches to account for low frequency contaminations and three procedures developed for perturbed fractional processes. We conduct an extensive Monte Carlo study for a variety of parameter constellations and several DGPs. Furthermore, an empirical application of the log-absolute return series of the S&P 500 shows that the estimation results combined with a long-memory test indicate a spurious long-memory process.

AB - Several modified estimation methods of the memory parameter have been introduced in the past years. They aim to decrease the upward bias of the memory parameter in cases of low frequency contaminations or an additive noise component, especially in situations with a short-memory process being contaminated. In this paper, we provide an overview and compare the performance of nine semiparametric estimation methods. Among them are two standard methods, four modified approaches to account for low frequency contaminations and three procedures developed for perturbed fractional processes. We conduct an extensive Monte Carlo study for a variety of parameter constellations and several DGPs. Furthermore, an empirical application of the log-absolute return series of the S&P 500 shows that the estimation results combined with a long-memory test indicate a spurious long-memory process.

KW - Low frequency contamination

KW - Monte Carlo simulation

KW - Perturbation

KW - Semiparametric estimation

KW - Spurious long memory

UR - http://www.scopus.com/inward/record.url?scp=85056766686&partnerID=8YFLogxK

U2 - 10.3390/econometrics6010013

DO - 10.3390/econometrics6010013

M3 - Article

AN - SCOPUS:85056766686

VL - 6

JO - Econometrics

JF - Econometrics

IS - 1

M1 - 13

ER -