An improved method to detect riblets on surfaces in nanometer scaling using SEM

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Beitrag in Buch/Sammelwerk › Forschung › Peer-Review

Autoren

  • E. Reithmeier
  • T. Vynnyk

Organisationseinheiten

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Details

OriginalspracheEnglisch
Titel des SammelwerksFrom Nano to Space
UntertitelApplied Mathematics Inspired by Roland Bulirsch
Seiten43-54
Seitenumfang12
PublikationsstatusVeröffentlicht - 2008

Abstract

An improved photometric method for recording a 3D-microtopogrpahy of technical surfaces will be presented. The suggested procedure employs a scanning electron microscope (SEM) as multi-detector system. The improvement in measurement is based on an extended model of the electron detection in order to evaluate the detectors signals in a different way compared to known approaches. The method will be applied on a calibration sphere in order to demonstrate the accuracy of the current approach.

ASJC Scopus Sachgebiete

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An improved method to detect riblets on surfaces in nanometer scaling using SEM. / Reithmeier, E.; Vynnyk, T.
From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. 2008. S. 43-54.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Beitrag in Buch/Sammelwerk › Forschung › Peer-Review

Reithmeier, E & Vynnyk, T 2008, An improved method to detect riblets on surfaces in nanometer scaling using SEM. in From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. S. 43-54. https://doi.org/10.1007/978-3-540-74238-8_5
Reithmeier, E., & Vynnyk, T. (2008). An improved method to detect riblets on surfaces in nanometer scaling using SEM. In From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch (S. 43-54) https://doi.org/10.1007/978-3-540-74238-8_5
Reithmeier E, Vynnyk T. An improved method to detect riblets on surfaces in nanometer scaling using SEM. in From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. 2008. S. 43-54 doi: 10.1007/978-3-540-74238-8_5
Reithmeier, E. ; Vynnyk, T. / An improved method to detect riblets on surfaces in nanometer scaling using SEM. From Nano to Space: Applied Mathematics Inspired by Roland Bulirsch. 2008. S. 43-54
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