Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 49th ARFTG Conference Digest - Spring 1997 |
| Untertitel | Characterization of Broadband Telecommunications Components and Systems |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 223-226 |
| Seitenumfang | 4 |
| ISBN (elektronisch) | 0780356861, 9780780356863 |
| Publikationsstatus | Veröffentlicht - 1997 |
| Veranstaltung | 49th ARFTG Conference Digest - Spring 1997 - Denver, USA / Vereinigte Staaten Dauer: 13 Juni 1997 → 13 Juni 1997 |
Publikationsreihe
| Name | 49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems |
|---|
Abstract
A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
ASJC Scopus Sachgebiete
- Informatik (insg.)
- Computernetzwerke und -kommunikation
- Informatik (insg.)
- Hardware und Architektur
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
Zitieren
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- BibTex
- RIS
49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems. Institute of Electrical and Electronics Engineers Inc., 1997. S. 223-226 4119917 (49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - An Accurate Determination of the Characteristic Impedance Matrix of Coupled Symmetrical Lines on Chips Baser on High Frequency S-Parameter Measurements
AU - Winkel, Thomas Michael
AU - Dutta, Lohit Sagar
AU - Grabinski, Hartmut
PY - 1997
Y1 - 1997
N2 - A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
AB - A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
UR - http://www.scopus.com/inward/record.url?scp=78651296218&partnerID=8YFLogxK
U2 - 10.1109/ARFTG.1997.327232
DO - 10.1109/ARFTG.1997.327232
M3 - Conference contribution
AN - SCOPUS:78651296218
T3 - 49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems
SP - 223
EP - 226
BT - 49th ARFTG Conference Digest - Spring 1997
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 49th ARFTG Conference Digest - Spring 1997
Y2 - 13 June 1997 through 13 June 1997
ER -