Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | ECCE 2016 |
| Untertitel | IEEE Energy Conversion Congress and Exposition, Proceedings |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (elektronisch) | 9781509007370 |
| Publikationsstatus | Veröffentlicht - 2016 |
| Veranstaltung | 2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016 - Milwaukee, USA / Vereinigte Staaten Dauer: 18 Sept. 2016 → 22 Sept. 2016 |
Publikationsreihe
| Name | ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings |
|---|
Abstract
This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Steuerungs- und Systemtechnik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Energie (insg.)
- Energieanlagenbau und Kraftwerkstechnik
- Mathematik (insg.)
- Steuerung und Optimierung
Zitieren
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- BibTex
- RIS
ECCE 2016 : IEEE Energy Conversion Congress and Exposition, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. 7854828 (ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Advanced condition monitoring system based on on-line semiconductor loss measurements
AU - Krone, Tobias
AU - Dang Hung, Lan
AU - Jung, Marco
AU - Mertens, Axel
PY - 2016
Y1 - 2016
N2 - This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.
AB - This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.
UR - http://www.scopus.com/inward/record.url?scp=85015368542&partnerID=8YFLogxK
U2 - 10.1109/ECCE.2016.7854828
DO - 10.1109/ECCE.2016.7854828
M3 - Conference contribution
AN - SCOPUS:85015368542
T3 - ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
BT - ECCE 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016
Y2 - 18 September 2016 through 22 September 2016
ER -