Accurate electrical measurement of coupled lines on lossy silicon

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Autoren

  • Uwe Arz
  • Dylan F. Williams
  • David K. Walker
  • Hartmut Grabinski

Organisationseinheiten

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Details

OriginalspracheEnglisch
Seiten181-184
Seitenumfang4
PublikationsstatusVeröffentlicht - 2000
Veranstaltung9th Topical Meeting on Electrical Performance of Electronic Packaging - Scottsdale, USA / Vereinigte Staaten
Dauer: 23 Okt. 2000 → 25 Okt. 2000

Konferenz

Konferenz9th Topical Meeting on Electrical Performance of Electronic Packaging
Land/GebietUSA / Vereinigte Staaten
OrtScottsdale
Zeitraum23 Okt. 2000 → 25 Okt. 2000

Abstract

In this paper we apply a measurement method designed for asymmetric coupled lines to determine the broadband propagation characteristics of symmetric coupled lines fabricated on a highly conductive silicon substrate. We show that the matrices of frequency-dependent propagation constants and characteristic impedances, as extracted from calibrated four-port S-parameter measurements, agree very well with data predicted by numerical calculations.

ASJC Scopus Sachgebiete

Zitieren

Accurate electrical measurement of coupled lines on lossy silicon. / Arz, Uwe; Williams, Dylan F.; Walker, David K. et al.
2000. 181-184 Beitrag in 9th Topical Meeting on Electrical Performance of Electronic Packaging, Scottsdale, Arizona, USA / Vereinigte Staaten.

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Arz, U, Williams, DF, Walker, DK & Grabinski, H 2000, 'Accurate electrical measurement of coupled lines on lossy silicon', Beitrag in 9th Topical Meeting on Electrical Performance of Electronic Packaging, Scottsdale, USA / Vereinigte Staaten, 23 Okt. 2000 - 25 Okt. 2000 S. 181-184. https://doi.org/10.1109/EPEP.2000.895523
Arz, U., Williams, D. F., Walker, D. K., & Grabinski, H. (2000). Accurate electrical measurement of coupled lines on lossy silicon. 181-184. Beitrag in 9th Topical Meeting on Electrical Performance of Electronic Packaging, Scottsdale, Arizona, USA / Vereinigte Staaten. https://doi.org/10.1109/EPEP.2000.895523
Arz U, Williams DF, Walker DK, Grabinski H. Accurate electrical measurement of coupled lines on lossy silicon. 2000. Beitrag in 9th Topical Meeting on Electrical Performance of Electronic Packaging, Scottsdale, Arizona, USA / Vereinigte Staaten. doi: 10.1109/EPEP.2000.895523
Arz, Uwe ; Williams, Dylan F. ; Walker, David K. et al. / Accurate electrical measurement of coupled lines on lossy silicon. Beitrag in 9th Topical Meeting on Electrical Performance of Electronic Packaging, Scottsdale, Arizona, USA / Vereinigte Staaten.4 S.
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