Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Autoren

  • Thomas Michael Winkel
  • Lohit Sagar Dutta
  • Hartmut Grabinski

Organisationseinheiten

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Details

OriginalspracheEnglisch
Seiten190-195
Seitenumfang6
PublikationsstatusVeröffentlicht - 1996
Veranstaltung1996 IEEE Multi-Chip Module Conference - Santa Cruz, USA / Vereinigte Staaten
Dauer: 6 Feb. 1996 → 7 Feb. 1996

Konferenz

Konferenz1996 IEEE Multi-Chip Module Conference
Land/GebietUSA / Vereinigte Staaten
OrtSanta Cruz
Zeitraum6 Feb. 1996 → 7 Feb. 1996

Abstract

A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

ASJC Scopus Sachgebiete

Zitieren

Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. / Winkel, Thomas Michael; Dutta, Lohit Sagar; Grabinski, Hartmut.
1996. 190-195 Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten.

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Winkel, TM, Dutta, LS & Grabinski, H 1996, 'Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements', Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, USA / Vereinigte Staaten, 6 Feb. 1996 - 7 Feb. 1996 S. 190-195. https://doi.org/10.1109/MCMC.1996.510793
Winkel, T. M., Dutta, L. S., & Grabinski, H. (1996). Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. 190-195. Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten. https://doi.org/10.1109/MCMC.1996.510793
Winkel TM, Dutta LS, Grabinski H. Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. 1996. Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten. doi: 10.1109/MCMC.1996.510793
Winkel, Thomas Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut. / Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. Beitrag in 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, USA / Vereinigte Staaten.6 S.
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@conference{b267a3c1853e434cab4d8930558a47a9,
title = "Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements",
abstract = "A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.",
author = "Winkel, {Thomas Michael} and Dutta, {Lohit Sagar} and Hartmut Grabinski",
year = "1996",
doi = "10.1109/MCMC.1996.510793",
language = "English",
pages = "190--195",
note = "1996 IEEE Multi-Chip Module Conference ; Conference date: 06-02-1996 Through 07-02-1996",

}

Download

TY - CONF

T1 - Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

AU - Winkel, Thomas Michael

AU - Dutta, Lohit Sagar

AU - Grabinski, Hartmut

PY - 1996

Y1 - 1996

N2 - A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

AB - A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

UR - http://www.scopus.com/inward/record.url?scp=0029771322&partnerID=8YFLogxK

U2 - 10.1109/MCMC.1996.510793

DO - 10.1109/MCMC.1996.510793

M3 - Paper

AN - SCOPUS:0029771322

SP - 190

EP - 195

T2 - 1996 IEEE Multi-Chip Module Conference

Y2 - 6 February 1996 through 7 February 1996

ER -