Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 51st ARFTG Conference Digest-Spring |
| Untertitel | Characterization of Spread Spectrum Telecommunications Components and Systems, ARFTG 1998 |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 155-158 |
| Seitenumfang | 4 |
| ISBN (elektronisch) | 0780356861, 9780780356863 |
| Publikationsstatus | Veröffentlicht - 1998 |
| Veranstaltung | 51st ARFTG Conference Digest-Spring, ARFTG 1998 - Baltimore, USA / Vereinigte Staaten Dauer: 12 Juni 1998 → 12 Juni 1998 |
Publikationsreihe
| Name | 51st ARFTG Conference Digest-Spring: Characterization of Spread Spectrum Telecommunications Components and Systems, ARFTG 1998 |
|---|
Abstract
This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.
ASJC Scopus Sachgebiete
- Informatik (insg.)
- Computernetzwerke und -kommunikation
- Physik und Astronomie (insg.)
- Instrumentierung
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- BibTex
- RIS
51st ARFTG Conference Digest-Spring: Characterization of Spread Spectrum Telecommunications Components and Systems, ARFTG 1998. Institute of Electrical and Electronics Engineers Inc., 1998. S. 155-158 (51st ARFTG Conference Digest-Spring: Characterization of Spread Spectrum Telecommunications Components and Systems, ARFTG 1998).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Accurate characteristic impedance measurement on silicon
AU - Williams, Dylan F.
AU - Arz, Uwe
AU - Grabinski, Hartmut
PY - 1998
Y1 - 1998
N2 - This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.
AB - This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.
UR - http://www.scopus.com/inward/record.url?scp=78651382268&partnerID=8YFLogxK
U2 - 10.1109/ARFTG.1998.327296
DO - 10.1109/ARFTG.1998.327296
M3 - Conference contribution
AN - SCOPUS:78651382268
T3 - 51st ARFTG Conference Digest-Spring: Characterization of Spread Spectrum Telecommunications Components and Systems, ARFTG 1998
SP - 155
EP - 158
BT - 51st ARFTG Conference Digest-Spring
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 51st ARFTG Conference Digest-Spring, ARFTG 1998
Y2 - 12 June 1998 through 12 June 1998
ER -