Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2019 Kleinheubach Conference, KHB 2019 |
| Untertitel | Proceedings |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seitenumfang | 4 |
| ISBN (elektronisch) | 978-3-948571-00-9 |
| ISBN (Print) | 978-1-7281-3161-0 |
| Publikationsstatus | Veröffentlicht - 2019 |
| Veranstaltung | 2019 Kleinheubach Conference, KHB 2019 - Miltenberg, Deutschland Dauer: 23 Sept. 2019 → 25 Sept. 2019 |
Abstract
This paper presents an RF imaging system capable of performing two-dimensional imaging of planar dielectric substrates at 120 GHz. The proposed system is built around a commercially available radar on chip solution and uses an unmodulated carrier, which greatly simplifies baseband sampling. Image reconstruction is performed by means of an FFT-based backward-wave reconstruction algorithm. We present exemplary imagery of an FR4 sample featuring a copper logo as well as a glass substrate sample featuring a laser-structured ITO coating. The images captured for the two samples allow clear identification of all relevant structures. In addition, we demonstrate that images of satisfying quality can be captured if the system's VCO is operated in free-running mode without an external PLL circuit.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Instrumentierung
- Physik und Astronomie (insg.)
- Strahlung
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Physik und Astronomie (insg.)
- Akustik und Ultraschall
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
2019 Kleinheubach Conference, KHB 2019: Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8890068.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - A two-dimensional continuous-wave imaging system for scanning of dielectric substrates at millimeter-wave frequencies
AU - Schwartau, Fabian
AU - Monka-Ewe, Carsten
AU - Caspary, Reinhard
AU - Kowalsky, Wolfgang
AU - Schöbel, Jörg
N1 - Funding information: We acknowledge funding by the Deutsche Forschungsge-meinschaft (DFG, German Research Foundation) under Ger-manys Excellence Strategy within the Cluster of Excellence PhoenixD (EXC 2122, Project ID 390833453).
PY - 2019
Y1 - 2019
N2 - This paper presents an RF imaging system capable of performing two-dimensional imaging of planar dielectric substrates at 120 GHz. The proposed system is built around a commercially available radar on chip solution and uses an unmodulated carrier, which greatly simplifies baseband sampling. Image reconstruction is performed by means of an FFT-based backward-wave reconstruction algorithm. We present exemplary imagery of an FR4 sample featuring a copper logo as well as a glass substrate sample featuring a laser-structured ITO coating. The images captured for the two samples allow clear identification of all relevant structures. In addition, we demonstrate that images of satisfying quality can be captured if the system's VCO is operated in free-running mode without an external PLL circuit.
AB - This paper presents an RF imaging system capable of performing two-dimensional imaging of planar dielectric substrates at 120 GHz. The proposed system is built around a commercially available radar on chip solution and uses an unmodulated carrier, which greatly simplifies baseband sampling. Image reconstruction is performed by means of an FFT-based backward-wave reconstruction algorithm. We present exemplary imagery of an FR4 sample featuring a copper logo as well as a glass substrate sample featuring a laser-structured ITO coating. The images captured for the two samples allow clear identification of all relevant structures. In addition, we demonstrate that images of satisfying quality can be captured if the system's VCO is operated in free-running mode without an external PLL circuit.
UR - http://www.scopus.com/inward/record.url?scp=85075174783&partnerID=8YFLogxK
M3 - Conference contribution
SN - 978-1-7281-3161-0
BT - 2019 Kleinheubach Conference, KHB 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 Kleinheubach Conference, KHB 2019
Y2 - 23 September 2019 through 25 September 2019
ER -